Tests of bias in log-periodogram regression
This paper proposes simple Hausman-type tests to check for bias in the log-periodogram regression of a time series believed to be long memory. The statistics are asymptotically standard normal on the null hypothesis that no bias is present, and the tests are consistent.
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- Hassler, Uwe & Marmol, Francesc & Velasco, Carlos, 2002.
"Residual Log-Periodogram Inference for Long-Run Relationships,"
Darmstadt Discussion Papers in Economics
115, Darmstadt University of Technology, Department of Law and Economics.
- Hassler, U. & Marmol, F. & Velasco, C., 2006. "Residual log-periodogram inference for long-run relationships," Journal of Econometrics, Elsevier, vol. 130(1), pages 165-207, January.
- Efstathios Paparoditis, 2000. "Spectral Density Based Goodness-of-Fit Tests for Time Series Models," Scandinavian Journal of Statistics, Danish Society for Theoretical Statistics;Finnish Statistical Society;Norwegian Statistical Association;Swedish Statistical Association, vol. 27(1), pages 143-176.
- Hsieh, Meng-Chen & Hurvich, Clifford M. & Soulier, Philippe, 2007.
"Asymptotics for duration-driven long range dependent processes,"
Journal of Econometrics,
Elsevier, vol. 141(2), pages 913-949, December.
- Mengchen Hsieh & Clifford Hurvich & Philippe Soulier, 2004. "Asymptotics for Duration-Driven Long Range Dependent Processes," Econometrics 0412009, EconWPA.
- Donald W.K. Andrews & Patrik Guggenberger, 2000.
"A Bias-Reduced Log-Periodogram Regression Estimator for the Long-Memory Parameter,"
Cowles Foundation Discussion Papers
1263, Cowles Foundation for Research in Economics, Yale University.
- Donald W. K. Andrews & Patrik Guggenberger, 2003. "A Bias--Reduced Log--Periodogram Regression Estimator for the Long--Memory Parameter," Econometrica, Econometric Society, vol. 71(2), pages 675-712, March.
- Davidson, James & Sibbertsen, Philipp, 2005.
"Generating schemes for long memory processes: regimes, aggregation and linearity,"
Journal of Econometrics,
Elsevier, vol. 128(2), pages 253-282, October.
- Davidson, James & Sibbertsen, Philipp, 2002. "Generating schemes for long memory processes: Regimes, aggregation and linearity," Technical Reports 2002,46, Technische Universität Dortmund, Sonderforschungsbereich 475: Komplexitätsreduktion in multivariaten Datenstrukturen.
- Chen, Willa W. & Deo, Rohit S., 2004. "A Generalized Portmanteau Goodness-Of-Fit Test For Time Series Models," Econometric Theory, Cambridge University Press, vol. 20(02), pages 382-416, April.
- Hausman, Jerry A, 1978.
"Specification Tests in Econometrics,"
Econometric Society, vol. 46(6), pages 1251-1271, November.
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