The relation between knowledge accumulation and technical value in interdisciplinary technologies
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DOI: 10.1016/j.techfore.2017.12.006
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Cited by:- Wang, Xiaoli & Liang, Wenting & Ye, Xuanting & Chen, Lingdi & Liu, Yun, 2024. "Disruptive development path measurement for emerging technologies based on the patent citation network," Journal of Informetrics, Elsevier, vol. 18(1).
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Keywords
Knowledge accumulation; Patent value; Technology forecasting; Technical value; Patent citation network;
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