Some Cautions on the Use of the LLC Panel Unit Root Test
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- Jisun Kim & Tugrul Daim, 2014. "A new approach to measuring time-lags in technology licensing: study of U.S. academic research institutions," The Journal of Technology Transfer, Springer, vol. 39(5), pages 748-773, October.
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Keywords
econometrics;NEP fields
This paper has been announced in the following NEP Reports:- NEP-ETS-2006-12-16 (Econometric Time Series)
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