Introduction: Invention Input-Output Analysis
The papers in this issue are directed towards the development of invention input-output (I(IO)) coefficients. They discuss the procedures for creating I(IO) coefficients using the Yale Technology Concordance, which assigns patented inventions to the industry of manufacture and sector of use, utilizing the International Patent Class system. Tests of reliability of the I(Io) coefficients and their use in economic studies are reported.
If you experience problems downloading a file, check if you have the proper application to view it first. In case of further problems read the IDEAS help page. Note that these files are not on the IDEAS site. Please be patient as the files may be large.
As the access to this document is restricted, you may want to look for a different version under "Related research" (further below) or search for a different version of it.
Volume (Year): 9 (1997)
Issue (Month): 2 ()
|Contact details of provider:|| Web page: http://www.tandfonline.com/CESR20|
|Order Information:||Web: http://www.tandfonline.com/pricing/journal/CESR20|
When requesting a correction, please mention this item's handle: RePEc:taf:ecsysr:v:9:y:1997:i:2:p:149-160. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Michael McNulty)
If references are entirely missing, you can add them using this form.