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Modeling probabilities of patent oppositions in a Bayesian semiparametric regression framework

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  • Alexander Jerak

  • Stefan Wagner

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  • Alexander Jerak & Stefan Wagner, 2006. "Modeling probabilities of patent oppositions in a Bayesian semiparametric regression framework," Empirical Economics, Springer, vol. 31(2), pages 513-533, June.
    • Handle: RePEc:spr:empeco:v:31:y:2006:i:2:p:513-533
    DOI: 10.1007/s00181-005-0047-0
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    References listed on IDEAS

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    1. Hall, B. & Jaffe, A. & Trajtenberg, M., 2001. "The NBER Patent Citations Data File: Lessons, Insights and Methodological Tools," Papers 2001-29, Tel Aviv.
    2. David J. Spiegelhalter & Nicola G. Best & Bradley P. Carlin & Angelika Van Der Linde, 2002. "Bayesian measures of model complexity and fit," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 64(4), pages 583-639, October.
    3. Jean O. Lanjouw & Mark Schankerman, 1999. "The Quality of Ideas: Measuring Innovation with Multiple Indicators," NBER Working Papers 7345, National Bureau of Economic Research, Inc.
    4. Harhoff, Dietmar & Scherer, Frederic M. & Vopel, Katrin, 2004. "Erratum to "Citations, family size, opposition and the value of patent rights" [Research Policy 32 (2003) 1343-1363]," Research Policy, Elsevier, vol. 33(2), pages 363-364, March.
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    Citations

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    Cited by:

    1. Nicolas van Zeebroeck, 2007. "Patents only live twice: a patent survival analysis in Europe," Working Papers CEB 07-028.RS, ULB -- Universite Libre de Bruxelles.
    2. Caviggioli, Federico & Scellato, Giuseppe & Ughetto, Elisa, 2013. "International patent disputes: Evidence from oppositions at the European Patent Office," Research Policy, Elsevier, vol. 42(9), pages 1634-1646.
    3. Rahul RK Kapoor & Nicolas van Zeebroeck, 2016. "The laws of action and reaction: on determinants of patent disputes in European chemical and drug industries," Working Papers TIMES² WP 2016-019, ULB -- Universite Libre de Bruxelles.
    4. Nadja Klein & Thomas Kneib & Stefan Lang, 2015. "Bayesian Generalized Additive Models for Location, Scale, and Shape for Zero-Inflated and Overdispersed Count Data," Journal of the American Statistical Association, Taylor & Francis Journals, vol. 110(509), pages 405-419, March.
    5. Malva, Antonio Della & Hussinger, Katrin, 2012. "Corporate science in the patent system: An analysis of the semiconductor technology," Journal of Economic Behavior & Organization, Elsevier, vol. 84(1), pages 118-135.
    6. Nicolas van Zeebroeck, 2011. "The puzzle of patent value indicators," Economics of Innovation and New Technology, Taylor & Francis Journals, vol. 20(1), pages 33-62.

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