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Designing repetitive screening procedures with imperfect inspections: An empirical Bayes approach

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  • Chun, Young H.

Abstract

A batch of expensive items, such as IC chips, is often inspected multiple times in a sequential manner to further discover more conforming items. After several rounds of screening, we need to estimate the number of conforming items that still remain in the batch. We propose in this paper an empirical Bayes estimation method and compare its performance with that of the traditional maximum likelihood method. In the repetitive screening procedure, another important decision problem is when to stop the screening process and salvage the remaining items. We propose various types of stopping rules and illustrate their procedures with a simulated inspection data. Finally, we explore various extensions to our empirical Bayes estimation method in multiple inspection plans.

Suggested Citation

  • Chun, Young H., 2016. "Designing repetitive screening procedures with imperfect inspections: An empirical Bayes approach," European Journal of Operational Research, Elsevier, vol. 253(3), pages 639-647.
  • Handle: RePEc:eee:ejores:v:253:y:2016:i:3:p:639-647
    DOI: 10.1016/j.ejor.2016.03.003
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    References listed on IDEAS

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    1. Young Chun, 2009. "Improving product quality by multiple inspections: Prior and posterior planning of serial inspection procedures," IISE Transactions, Taylor & Francis Journals, vol. 41(9), pages 831-842.
    2. Ding, Jie & Gong, Linguo, 2008. "The effect of testing equipment shift on optimal decisions in a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 186(1), pages 330-350, April.
    3. Chun, Young H. & Sumichrast, Robert T., 2007. "Bayesian inspection model with the negative binomial prior in the presence of inspection errors," European Journal of Operational Research, Elsevier, vol. 182(3), pages 1188-1202, November.
    4. Jihong Ou & Lawrence M. Wein, 1996. "Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability," Operations Research, INFORMS, vol. 44(1), pages 196-205, February.
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    6. Quinino, R. C. & Lee Ho, L., 2004. "Repetitive tests as an economic alternative procedure to control attributes with diagnosis errors," European Journal of Operational Research, Elsevier, vol. 155(1), pages 209-225, May.
    7. Young H. Chun, 2008. "Bayesian Analysis of the Sequential Inspection Plan via the Gibbs Sampler," Operations Research, INFORMS, vol. 56(1), pages 235-246, February.
    8. Young Chun, 2010. "Bayesian inspection model for the production process subject to a random failure," IISE Transactions, Taylor & Francis Journals, vol. 42(4), pages 304-316.
    9. Douglas G. Bonett & J. Arthur Woodward, 1994. "Sequential Defect Removal Sampling," Management Science, INFORMS, vol. 40(7), pages 898-902, July.
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    12. Gong, Linguo, 2012. "The effect of testing errors on a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 220(1), pages 115-124.
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    Cited by:

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    2. Pala, Ali & Zhuang, Jun, 2018. "Security screening queues with impatient applicants: A new model with a case study," European Journal of Operational Research, Elsevier, vol. 265(3), pages 919-930.

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