Repetitive Testing Strategies When the Testing Process Is Imperfect
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Abstract
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DOI: 10.1287/mnsc.44.10.1367
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References listed on IDEAS
- Gary D. Eppen & E. Gerald Hurst, Jr., 1974. "Optimal Location of Inspection Stations in a Multistage Production Process," Management Science, INFORMS, vol. 20(8), pages 1194-1200, April.
- Hau L. Lee, 1992. "Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework," Management Science, INFORMS, vol. 38(9), pages 1314-1328, September.
Citations
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Cited by:
- Ding, Jie & Gong, Linguo, 2008. "The effect of testing equipment shift on optimal decisions in a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 186(1), pages 330-350, April.
- Chun, Young H., 2016. "Designing repetitive screening procedures with imperfect inspections: An empirical Bayes approach," European Journal of Operational Research, Elsevier, vol. 253(3), pages 639-647.
- Cen Song & Jun Zhuang, 2017. "Two-stage security screening strategies in the face of strategic applicants, congestions and screening errors," Annals of Operations Research, Springer, vol. 258(2), pages 237-262, November.
- Costa Quinino, Roberto da & Colin, Emerson C. & Ho, Linda Lee, 2010. "Diagnostic errors and repetitive sequential classifications in on-line process control by attributes," European Journal of Operational Research, Elsevier, vol. 201(1), pages 231-238, February.
- Gong, Linguo, 2012. "The effect of testing errors on a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 220(1), pages 115-124.
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Keywords
Computer/Electronic Industry; Semiconductor Manufacturing; Inspection; Optimal Testing Strategies;All these keywords.
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