Repetitive Testing Strategies When the Testing Process Is Imperfect
Author
Abstract
Suggested Citation
DOI: 10.1287/mnsc.44.10.1367
Download full text from publisher
References listed on IDEAS
- Hau L. Lee, 1992. "Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework," Management Science, INFORMS, vol. 38(9), pages 1314-1328, September.
- Gary D. Eppen & E. Gerald Hurst, Jr., 1974. "Optimal Location of Inspection Stations in a Multistage Production Process," Management Science, INFORMS, vol. 20(8), pages 1194-1200, April.
Citations
Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
Cited by:
- Ding, Jie & Gong, Linguo, 2008. "The effect of testing equipment shift on optimal decisions in a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 186(1), pages 330-350, April.
- Chun, Young H., 2016. "Designing repetitive screening procedures with imperfect inspections: An empirical Bayes approach," European Journal of Operational Research, Elsevier, vol. 253(3), pages 639-647.
- Cen Song & Jun Zhuang, 2017. "Two-stage security screening strategies in the face of strategic applicants, congestions and screening errors," Annals of Operations Research, Springer, vol. 258(2), pages 237-262, November.
- Costa Quinino, Roberto da & Colin, Emerson C. & Ho, Linda Lee, 2010. "Diagnostic errors and repetitive sequential classifications in on-line process control by attributes," European Journal of Operational Research, Elsevier, vol. 201(1), pages 231-238, February.
- Gong, Linguo, 2012. "The effect of testing errors on a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 220(1), pages 115-124.
Most related items
These are the items that most often cite the same works as this one and are cited by the same works as this one.- K-L Hou, 2005. "Optimal production run length for deteriorating production system with a two-state continuous-time Markovian processes under allowable shortages," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 56(3), pages 346-350, March.
- Singa Wang Chiu & Liang-Wei You & Tsu-Ming Yeh & Tiffany Chiu, 2020. "The Collective Influence of Component Commonality, Adjustable-Rate, Postponement, and Rework on Multi-Item Manufacturing Decision," Mathematics, MDPI, vol. 8(9), pages 1-18, September.
- Yu, Hong-Fwu & Yu, Wen-Ching, 2007. "An optimal mixed policy of inspection and burn-in and the optimal production quantity," International Journal of Production Economics, Elsevier, vol. 105(2), pages 483-491, February.
- Jinfa Chen & David D. Yao & Shaohui Zheng, 2001. "Optimal Replenishment and Rework with Multiple Unreliable Supply Sources," Operations Research, INFORMS, vol. 49(3), pages 430-443, June.
- Wang, Chih-Hsiung, 2009. "Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing," European Journal of Operational Research, Elsevier, vol. 197(1), pages 126-133, August.
- Chang, Seokcheol & Klabjan, Diego & Vossen, Thomas, 2010. "Optimal radio frequency identification deployment in a supply chain network," International Journal of Production Economics, Elsevier, vol. 125(1), pages 71-83, May.
- G C Hadjinicola, 2010. "Manufacturing costs in serial production systems with rework," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 61(2), pages 342-351, February.
- Y H Kang & S S Kim & H J Shin, 2010. "A dispatching algorithm for parallel machines with rework processes," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 61(1), pages 144-155, January.
- Gong, Linguo, 2012. "The effect of testing errors on a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 220(1), pages 115-124.
- Ding, Jie & Gong, Linguo, 2008. "The effect of testing equipment shift on optimal decisions in a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 186(1), pages 330-350, April.
- Flapper, Simme Douwe P. & Teunter, Ruud H., 2004. "Logistic planning of rework with deteriorating work-in-process," International Journal of Production Economics, Elsevier, vol. 88(1), pages 51-59, March.
- Kim, Chang Hyun & Hong, Yushin, 1997. "An extended EMQ model for a failure prone machine with general lifetime distribution," International Journal of Production Economics, Elsevier, vol. 49(3), pages 215-223, May.
- Wang, H.S., 2009. "A two-phase ant colony algorithm for multi-echelon defective supply chain network design," European Journal of Operational Research, Elsevier, vol. 192(1), pages 243-252, January.
- Jewkes, Elizabeth M., 1995. "Optimal inspection effort and scheduling for a manufacturing process with repair," European Journal of Operational Research, Elsevier, vol. 85(2), pages 340-351, September.
- Muhammad Tayyab & Biswajit Sarkar & Bernardo Nugroho Yahya, 2018. "Imperfect Multi-Stage Lean Manufacturing System with Rework under Fuzzy Demand," Mathematics, MDPI, vol. 7(1), pages 1-18, December.
- Oner, Selma & Bilgic, Taner, 2008. "Economic lot scheduling with uncontrolled co-production," European Journal of Operational Research, Elsevier, vol. 188(3), pages 793-810, August.
- Barad, M. & Bennett, G., 1996. "Optimal yield improvement in multi-stage manufacturing systems," European Journal of Operational Research, Elsevier, vol. 95(3), pages 549-565, December.
- Gurnani, Haresh & Drezner, Zvi & Akella, Ram, 1996. "Capacity planning under different inspection strategies," European Journal of Operational Research, Elsevier, vol. 89(2), pages 302-312, March.
- Van Volsem, Sofie & Dullaert, Wout & Van Landeghem, Hendrik, 2007. "An Evolutionary Algorithm and discrete event simulation for optimizing inspection strategies for multi-stage processes," European Journal of Operational Research, Elsevier, vol. 179(3), pages 621-633, June.
- Biswajit Sarkar & Mehran Ullah & Seok-Beom Choi, 2019. "Joint Inventory and Pricing Policy for an Online to Offline Closed-Loop Supply Chain Model with Random Defective Rate and Returnable Transport Items," Mathematics, MDPI, vol. 7(6), pages 1-20, June.
More about this item
Keywords
Computer/Electronic Industry; Semiconductor Manufacturing; Inspection; Optimal Testing Strategies;All these keywords.
Statistics
Access and download statisticsCorrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:inm:ormnsc:v:44:y:1998:i:10:p:1367-1378. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Asher (email available below). General contact details of provider: https://edirc.repec.org/data/inforea.html .
Please note that corrections may take a couple of weeks to filter through the various RePEc services.