IDEAS home Printed from https://ideas.repec.org/a/eee/ejores/v197y2009i1p126-133.html
   My bibliography  Save this article

Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing

Author

Listed:
  • Wang, Chih-Hsiung

Abstract

In this study, we reformulated the problem of wafer probe operation in semiconductor manufacturing to consider a probe machine (PM) which has a discrete Weibull shift distribution with a nondecreasing failure rate. To maintain the imperfect PM during the probing of a lot of wafers, a minimal repair policy is introduced with type II inspection error. To increase the productivity of the PM, this paper aims to find an optimal probing lot size that minimizes the expected average processing time per wafer. Conditions and uniqueness for the optimal lot size are explored. The special case of a geometric shift distribution is studied to find a tighter upper bound on the optimal lot size than in previous study. Numerical examples are performed to evaluate the impacts of minimal repair on the optimal lot size. In addition, the adequacy of using a geometric shift distribution is examined when the actual shift distribution has an increasing failure rate.

Suggested Citation

  • Wang, Chih-Hsiung, 2009. "Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing," European Journal of Operational Research, Elsevier, vol. 197(1), pages 126-133, August.
    • Handle: RePEc:eee:ejores:v:197:y:2009:i:1:p:126-133
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0377-2217(08)00446-3
    Download Restriction: Full text for ScienceDirect subscribers only
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    References listed on IDEAS

    as
    1. Djamaludin, I. & Murthy, D. N. P. & Wilson, R. J., 1994. "Quality control through lot sizing for items sold with warranty," International Journal of Production Economics, Elsevier, vol. 33(1-3), pages 97-107, January.
    2. Wang, Chih-Hsiung & Sheu, Shey-Heui, 2003. "Optimal lot sizing for products sold under free-repair warranty," European Journal of Operational Research, Elsevier, vol. 149(1), pages 131-141, August.
    3. Hau L. Lee, 1992. "Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework," Management Science, INFORMS, vol. 38(9), pages 1314-1328, September.
    4. Yeh, Ruey Huei & Chen, Tzu-Hui, 2006. "Optimal lot size and inspection policy for products sold with warranty," European Journal of Operational Research, Elsevier, vol. 174(2), pages 766-776, October.
    5. Wang, Chih-Hsiung, 2005. "Integrated production and product inspection policy for a deteriorating production system," International Journal of Production Economics, Elsevier, vol. 95(1), pages 123-134, January.
    6. Evan L. Porteus, 1986. "Optimal Lot Sizing, Process Quality Improvement and Setup Cost Reduction," Operations Research, INFORMS, vol. 34(1), pages 137-144, February.
    Full references (including those not matched with items on IDEAS)

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. K-L Hou, 2005. "Optimal production run length for deteriorating production system with a two-state continuous-time Markovian processes under allowable shortages," Journal of the Operational Research Society, Palgrave Macmillan;The OR Society, vol. 56(3), pages 346-350, March.
    2. Giri, B.C. & Dohi, T., 2007. "Inspection scheduling for imperfect production processes under free repair warranty contract," European Journal of Operational Research, Elsevier, vol. 183(1), pages 238-252, November.
    3. Hu, Fei & Zong, Qun, 2009. "Optimal production run time for a deteriorating production system under an extended inspection policy," European Journal of Operational Research, Elsevier, vol. 196(3), pages 979-986, August.
    4. Da Wen & Pan Ershun & Wang Ying & Liao Wenzhu, 2016. "An economic production quantity model for a deteriorating system integrated with predictive maintenance strategy," Journal of Intelligent Manufacturing, Springer, vol. 27(6), pages 1323-1333, December.
    5. Yeh, Ruey Huei & Ho, Wen-Tsung & Tseng, Sheng-Tsaing, 2000. "Optimal production run length for products sold with warranty," European Journal of Operational Research, Elsevier, vol. 120(3), pages 575-582, February.
    6. Wright, CM & Mehrez, A, 1998. "An Overview of Representative Research of the Relationships Between Quality and Inventory," Omega, Elsevier, vol. 26(1), pages 29-47, February.
    7. B. C. Giri & T Chakraborty, 2007. "Optimal production, maintenance, and warranty strategies for item sold with rebate combination warranty," Journal of Risk and Reliability, , vol. 221(4), pages 257-264, December.
    8. Yoo, Seung Ho & Kim, DaeSoo & Park, Myung-Sub, 2009. "Economic production quantity model with imperfect-quality items, two-way imperfect inspection and sales return," International Journal of Production Economics, Elsevier, vol. 121(1), pages 255-265, September.
    9. Bimal Kumar Sett & Bikash Koli Dey & Biswajit Sarkar, 2020. "Autonomated Inspection Policy for Smart Factory—An Improved Approach," Mathematics, MDPI, vol. 8(10), pages 1-19, October.
    10. Ivan Darma Wangsa & Hui Ming Wee & Shih-Hsien Tseng, 2019. "A coordinated vendor–buyer system considering loss and damage claims, insurance cost and stochastic lead time," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 10(3), pages 384-398, June.
    11. Sarkar, Biswajit & Saren, Sharmila, 2016. "Product inspection policy for an imperfect production system with inspection errors and warranty cost," European Journal of Operational Research, Elsevier, vol. 248(1), pages 263-271.
    12. Wei Huang & Vidyadhar Kulkarni & Jayashankar M. Swaminathan, 2008. "Managing the Inventory of an Item with a Replacement Warranty," Management Science, INFORMS, vol. 54(8), pages 1441-1452, August.
    13. Izzet Sahin & Hakan Polatoglu, 1995. "Distributions of manufacturer's and user's replacement costs under warranty," Naval Research Logistics (NRL), John Wiley & Sons, vol. 42(8), pages 1233-1250, December.
    14. Gong, Linguo, 2012. "The effect of testing errors on a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 220(1), pages 115-124.
    15. Ding, Jie & Gong, Linguo, 2008. "The effect of testing equipment shift on optimal decisions in a repetitive testing process," European Journal of Operational Research, Elsevier, vol. 186(1), pages 330-350, April.
    16. Kim, Chang Hyun & Hong, Yushin, 1997. "An extended EMQ model for a failure prone machine with general lifetime distribution," International Journal of Production Economics, Elsevier, vol. 49(3), pages 215-223, May.
    17. Wang, Chih-Hsiung & Sheu, Shey-Heui, 2003. "Optimal lot sizing for products sold under free-repair warranty," European Journal of Operational Research, Elsevier, vol. 149(1), pages 131-141, August.
    18. Oner, Selma & Bilgic, Taner, 2008. "Economic lot scheduling with uncontrolled co-production," European Journal of Operational Research, Elsevier, vol. 188(3), pages 793-810, August.
    19. Lee, Hsu-Hua, 2008. "The investment model in preventive maintenance in multi-level production systems," International Journal of Production Economics, Elsevier, vol. 112(2), pages 816-828, April.
    20. Rezaei, Jafar & Salimi, Negin, 2012. "Economic order quantity and purchasing price for items with imperfect quality when inspection shifts from buyer to supplier," International Journal of Production Economics, Elsevier, vol. 137(1), pages 11-18.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:ejores:v:197:y:2009:i:1:p:126-133. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: http://www.elsevier.com/locate/eor .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.