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Re-examine the relationship between patents and Tobin’s q

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  • Yu-Shan Chen

    (National Taipei University)

  • Chun-Yu Shih

    (National Yunlin University of Science & Technology)

Abstract

Since the relationship between patents and Tobin’s q is confusing, this paper utilizes panel threshold regression model to re-examine the relationship between patent counts/sales and Tobin’s q. This study finds out patent citations/sales has a single threshold effect on the relationship between patent counts/sales and Tobin’s q in the US pharmaceutical industry. The single threshold value of patent citations/sales is 328.81, and it divides the value of patent citations/sales into two regimes: the first regime (patent citations/sale ≦ 328.81) and the second regime (patent citations/sale > 328.81). The results indicate that patent counts/sales positively affect Tobin’s q in the two regimes. In addition, this study demonstrates that the extent of the positive effect of patent counts/sales on Tobin’s q is different. This study verifies that patent citations/sales moderates the relationship between patent counts/sales and Tobin’s q. Once patent citations/sales is below the threshold value, the extent of the positive relationship between patent counts/sales and Tobin’s q is the most. Therefore, this study finds out that the first regime is optimal.

Suggested Citation

  • Yu-Shan Chen & Chun-Yu Shih, 2011. "Re-examine the relationship between patents and Tobin’s q," Scientometrics, Springer;Akadémiai Kiadó, vol. 89(3), pages 781-794, December.
    • Handle: RePEc:spr:scient:v:89:y:2011:i:3:d:10.1007_s11192-011-0471-1
    DOI: 10.1007/s11192-011-0471-1
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    3. Jiang, Cuiqing & Zhou, Yiru & Chen, Bo, 2023. "Mining semantic features in patent text for financial distress prediction," Technological Forecasting and Social Change, Elsevier, vol. 190(C).
    4. Yu-Shan Chen & Chun-Yu Shih & Ching-Hsun Chang, 2014. "Explore the new relationship between patents and market value: a panel smooth transition regression (PSTR) approach," Scientometrics, Springer;Akadémiai Kiadó, vol. 98(2), pages 1145-1159, February.

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