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An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

Author

Listed:
  • Yong-Gil Lee

    (Korea Institute of Science and Technology)

  • Jeong-Dong Lee

    (Seoul National University)

  • Yong-Il Song

    (Korea Institute of Science and Technology)

  • Se-Jun Lee

    (Ministry of Science and Technology)

Abstract

Patent citation counts represent an aspect of patent quality and knowledge flow. Especially, citation data of US patents contain most valuable pieces of the information among other patents. This paper identifies the factors affecting patent citation counts using US patents belonging to Korea Institute of Science and Technology (KIST). For patent citation count model, zero-inflated models are announced to handle the excess zero data. For explanatory factors, research team characteristics, invention-specific characteristics, and geographical domain related characteristics are suggested. As results, the size of invention and the degree of dependence upon Japanese technological domain significantly affect patent citation counts of KIST.

Suggested Citation

  • Yong-Gil Lee & Jeong-Dong Lee & Yong-Il Song & Se-Jun Lee, 2007. "An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST," Scientometrics, Springer;Akadémiai Kiadó, vol. 70(1), pages 27-39, January.
    • Handle: RePEc:spr:scient:v:70:y:2007:i:1:d:10.1007_s11192-007-0102-z
    DOI: 10.1007/s11192-007-0102-z
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    References listed on IDEAS

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