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Modèles de comptage semi-paramétriques

Listed author(s):
  • Gouriéroux, Christian

    (CREST-CEPREMAP)

  • Monfort, Alain

    (CREST)

In this paper, we introduce a new class of models for count endogenous variables, i.e. the additive log-differentiated probability models (ALDP). This class is similar to the semi-parametric proportional hazard models used for duration data, and has some interesting implications in terms of costs or benefits. The asymptotic properties of the maximum likelihood estimators are studied and compared with the properties of the discriminant analysis estimators. We also explain why these models are suitable in the framework of endogenous sampling. Finally we discuss the introduction of heterogeneity. Dans cet article nous définissons une nouvelle classe de modèles pour les variables endogènes entières : les modèles additifs log-différenciés en probabilité (ALDP). Cette classe a des analogies avec les modèles semi-paramétriques de hasard proportionnel pour les modèles de durées et a des interprétations intéressantes en terme de coûts (ou de bénéfices). Les propriétés asymptotiques des estimateurs du maximum de vraisemblance pour ces modèles sont étudiées et comparées à celles des estimateurs de l’analyse discriminante. On propose également des estimateurs adaptés au cas d’échantillons stratifiés de façon exogène ou endogène. Enfin, le cas d’observations hétérogènes est discuté.

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Article provided by Société Canadienne de Science Economique in its journal L'Actualité économique.

Volume (Year): 73 (1997)
Issue (Month): 1 (mars-juin-septembre)
Pages: 525-550

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Handle: RePEc:ris:actuec:v:73:y:1997:i:1:p:525-550
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  1. Szroeter, Jerzy, 1983. "Generalized Wald Methods for Testing Nonlinear Implicit and Overidentifying Restrictions," Econometrica, Econometric Society, vol. 51(2), pages 335-353, March.
  2. Dionne, G & Vanasse, C, 1992. "Automobile Insurance Ratemaking in the Presence of Asymmetrical Information," Journal of Applied Econometrics, John Wiley & Sons, Ltd., vol. 7(2), pages 149-165, April-Jun.
  3. Gourieroux, Christian & Monfort, Alain & Trognon, Alain, 1984. "Pseudo Maximum Likelihood Methods: Applications to Poisson Models," Econometrica, Econometric Society, vol. 52(3), pages 701-720, May.
  4. Hall, Bronwyn H & Griliches, Zvi & Hausman, Jerry A, 1986. "Patents and R and D: Is There a Lag?," International Economic Review, Department of Economics, University of Pennsylvania and Osaka University Institute of Social and Economic Research Association, vol. 27(2), pages 265-283, June.
  5. Heckman, James J. & Singer, Burton, 1984. "Econometric duration analysis," Journal of Econometrics, Elsevier, vol. 24(1-2), pages 63-132.
  6. Cameron, A Colin & Trivedi, Pravin K, 1986. "Econometric Models Based on Count Data: Comparisons and Applications of Some Estimators and Tests," Journal of Applied Econometrics, John Wiley & Sons, Ltd., vol. 1(1), pages 29-53, January.
  7. Gourieroux, C. & Monfort, A., 1989. "A General Framework for Testing a Null Hypothesis in a “Mixed” Form," Econometric Theory, Cambridge University Press, vol. 5(01), pages 63-82, April.
  8. repec:crs:wpaper:8903 is not listed on IDEAS
  9. Michael Hoy, 1982. "Categorizing Risks in the Insurance Industry," The Quarterly Journal of Economics, Oxford University Press, vol. 97(2), pages 321-336.
  10. Hausman, Jerry & Hall, Bronwyn H & Griliches, Zvi, 1984. "Econometric Models for Count Data with an Application to the Patents-R&D Relationship," Econometrica, Econometric Society, vol. 52(4), pages 909-938, July.
  11. Boyer, Marcel & Dionne, Georges, 1989. "An Empirical Analysis of Moral Hazard and Experience Rating," The Review of Economics and Statistics, MIT Press, vol. 71(1), pages 128-134, February.
  12. Lo, Andrew W., 1986. "Logit versus discriminant analysis : A specification test and application to corporate bankruptcies," Journal of Econometrics, Elsevier, vol. 31(2), pages 151-178, March.
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