Cognitive Distances in Prior Art Search by the Triadic Patent Offices: Empirical evidence from international search reports
Download full text from publisher
References listed on IDEAS
- Juan Alcácer & Michelle Gittelman, 2006. "Patent Citations as a Measure of Knowledge Flows: The Influence of Examiner Citations," The Review of Economics and Statistics, MIT Press, vol. 88(4), pages 774-779, November.
- Manuel Trajtenberg, 1990. "A Penny for Your Quotes: Patent Citations and the Value of Innovations," RAND Journal of Economics, The RAND Corporation, vol. 21(1), pages 172-187, Spring.
- Adam B. Jaffe & Manuel Trajtenberg & Rebecca Henderson, 1993.
"Geographic Localization of Knowledge Spillovers as Evidenced by Patent Citations,"
The Quarterly Journal of Economics, Oxford University Press, vol. 108(3), pages 577-598.
- Adam B. Jaffe & Manuel Trajtenberg & Rebecca Henderson, 1992. "Geographic Localization of Knowledge Spillovers as Evidenced by Patent Citations," NBER Working Papers 3993, National Bureau of Economic Research, Inc.
- Jaffe, A.B. & Trajtenberg, M., 1992. "Geographic Localization of Knowledge Spillovers as Evidenced by Patent Citations," Papers 14-92, Tel Aviv.
- Criscuolo, Paola & Verspagen, Bart, 2008. "Does it matter where patent citations come from? Inventor vs. examiner citations in European patents," Research Policy, Elsevier, vol. 37(10), pages 1892-1908, December.
- Michael D. Frakes & Melissa F. Wasserman, 2014. "Is the Time Allocated to Review Patent Applications Inducing Examiners to Grant Invalid Patents?: Evidence from Micro-Level Application Data," NBER Working Papers 20337, National Bureau of Economic Research, Inc.
- Mark A. Lemley & Bhaven Sampat, 2012. "Examiner Characteristics and Patent Office Outcomes," The Review of Economics and Statistics, MIT Press, vol. 94(3), pages 817-827, August.
- Adam Jaffe & Manuel Trajtenberg, 1999.
"International Knowledge Flows: Evidence From Patent Citations,"
Economics of Innovation and New Technology, Taylor & Francis Journals, vol. 8(1-2), pages 105-136.
- Adam B. Jaffe & Manuel Trajtenberg, 1998. "International Knowledge Flows: Evidence from Patent Citations," NBER Working Papers 6507, National Bureau of Economic Research, Inc.
- Jaffe, A.B. & Trajtenberg, M., 1998. "International Knowledge Flows: Evidence from Patent Citation," Papers 11-98, Tel Aviv.
- Emmanuel Duguet & Megan MacGarvie, 2005.
"How well do patent citations measure flows of technology? Evidence from French innovation surveys,"
Economics of Innovation and New Technology, Taylor & Francis Journals, vol. 14(5), pages 375-393.
- DUGUET Emmanuel & MacGARVIE Megan, 2004. "How Well Do Patent Citations Measure Flows of Technology? Evidence from French Innovation Surveys," Development and Comp Systems 0411018, University Library of Munich, Germany.
- Alfons Palangkaraya & Elizabeth Webster & Paul H. Jensen, 2011. "Misclassification between Patent Offices: Evidence from a Matched Sample of Patent Applications," The Review of Economics and Statistics, MIT Press, vol. 93(3), pages 1063-1075, August.
- Cotropia, Christopher A. & Lemley, Mark A. & Sampat, Bhaven, 2013. "Do applicant patent citations matter?," Research Policy, Elsevier, vol. 42(4), pages 844-854.
- Manuel Trajtenberg & Adam B. Jaffe & Michael S. Fogarty, 2000. "Knowledge Spillovers and Patent Citations: Evidence from a Survey of Inventors," American Economic Review, American Economic Association, vol. 90(2), pages 215-218, May.
- Elizabeth Webster & Paul H. Jensen & Alfons Palangkaraya, 2014. "Patent examination outcomes and the national treatment principle," RAND Journal of Economics, RAND Corporation, vol. 45(2), pages 449-469, June.
- Webster, Elizabeth & Palangkaraya, Alfons & Jensen, Paul H., 2007. "Characteristics of international patent application outcomes," Economics Letters, Elsevier, vol. 95(3), pages 362-368, June.
More about this item
NEP fieldsThis paper has been announced in the following NEP Reports:
- NEP-EUR-2015-08-25 (Microeconomic European Issues)
- NEP-INO-2015-08-25 (Innovation)
- NEP-IPR-2015-08-25 (Intellectual Property Rights)
StatisticsAccess and download statistics
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eti:dpaper:15096. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (TANIMOTO, Toko). General contact details of provider: http://edirc.repec.org/data/rietijp.html .
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
Please note that corrections may take a couple of weeks to filter through the various RePEc services.