Close to you? Bias and precision in patent-based measures of technological proximity
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- Mary Benner & Joel Waldfogel, 2007. "Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity," NBER Working Papers 13322, National Bureau of Economic Research, Inc.
References listed on IDEAS
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More about this item
- O31 - Economic Development, Innovation, Technological Change, and Growth - - Innovation; Research and Development; Technological Change; Intellectual Property Rights - - - Innovation and Invention: Processes and Incentives
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