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Issues in measuring the degree of technological specialisation with patent data

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  • Nicolas van Zeebroeck
  • Bruno Van Pottelsberghe
  • Wook Han

Abstract

This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system.

Suggested Citation

  • Nicolas van Zeebroeck & Bruno Van Pottelsberghe & Wook Han, 2005. "Issues in measuring the degree of technological specialisation with patent data," Working Papers CEB 05-016.RS, ULB -- Universite Libre de Bruxelles.
  • Handle: RePEc:sol:wpaper:05-016
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    References listed on IDEAS

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    5. Bruno Van Pottelsberghe & Herman Denis & Dominique Guellec, 2001. "Using patent counts for cross-country comparisons of technology output," ULB Institutional Repository 2013/6227, ULB -- Universite Libre de Bruxelles.
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    More about this item

    Keywords

    Technological specialisation; patent data; patents statistics;
    All these keywords.

    JEL classification:

    • L16 - Industrial Organization - - Market Structure, Firm Strategy, and Market Performance - - - Industrial Organization and Macroeconomics; Macroeconomic Industrial Structure
    • O57 - Economic Development, Innovation, Technological Change, and Growth - - Economywide Country Studies - - - Comparative Studies of Countries

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