MAcMap-HS6 2007, an exhaustive and consistent measure of applied protection in 2007
The third version of the MAcMap-HS6 database, built as a result of a joint effort of CEPII (Centre d'Études Prospectives et d’Informations Internationales, Paris) and ITC (International Trade Centre, Geneva), based on ITC’s MAcMap raw data, proposes an exhaustive and consistent measure of applied, preferential tariff protection in 2007. The methodology, similar to the one used for previous versions, relies on reference groups of countries to limit the endogeneity bias faced when computing ad valorem equivalents of tariff protection, and when computing averages at aggregate levels. The world average applied protection level in 2007 is estimated to be 4.4%. Compared to 2004, this is a decline by nearly 0.7 percentage point, mainly due to unilateral liberalizations and to new preferential trade agreements. The decline in the ad valorem equivalent of specific tariffs of some agricultural products, linked to the surge in world prices, lowers the average protection. In the opposite way, the increasing share of developing countries, where protection is higher, tend to raise the world average.
|Date of creation:||May 2012|
|Contact details of provider:|| Postal: 113, rue de Grenelle, 75700 Paris SP07|
Phone: 33 01 53 68 55 00
Fax: 33 01 53 68 55 01
Web page: http://www.cepii.fr
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References listed on IDEAS
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- Antoine Bouët & Yvan Decreux & Lionel Fontagné & Sébastien Jean & David Laborde, 2004. "A Consistent, Ad-Valorem Equivalent Measure of Applied Protection Across the World: The MAcMap-HS6 Database," Working Papers 2004-22, CEPII research center.
- Antoine Bouët & Yvan Decreux & Lionel Fontagné & Sébastien Jean & David Laborde, 2008. "Assessing Applied Protection across the World," Review of International Economics, Wiley Blackwell, vol. 16(5), pages 850-863, November.
- Antoine Bouet & Yvan Decreux & Lionel Fontagné & Sébastien Jean & David Laborde, 2008. "Assessing Applied Protection across the World," Université Paris1 Panthéon-Sorbonne (Post-Print and Working Papers) hal-00307910, HAL.
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