A novel deep learning motivated data augmentation system based on defect segmentation requirements
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DOI: 10.1007/s10845-022-02068-y
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- Domen Tabernik & Samo Šela & Jure Skvarč & Danijel Skočaj, 2020. "Segmentation-based deep-learning approach for surface-defect detection," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 759-776, March.
- Chia-Yu Hsu & Wei-Chen Liu, 2021. "Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 32(3), pages 823-836, March.
- Tobias Schlosser & Michael Friedrich & Frederik Beuth & Danny Kowerko, 2022. "Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1099-1123, April.
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Keywords
Defect detection; Image segmentation; Data augmentation; Deep learning;All these keywords.
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