Hierarchical multi-scale network for cross-scale visual defect detection
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DOI: 10.1007/s10845-023-02097-1
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- Ruizhen Liu & Zhiyi Sun & Anhong Wang & Kai Yang & Yin Wang & Qianlai Sun, 2020. "Real-time defect detection network for polarizer based on deep learning," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1813-1823, December.
- Saksham Jain & Gautam Seth & Arpit Paruthi & Umang Soni & Girish Kumar, 2022. "Synthetic data augmentation for surface defect detection and classification using deep learning," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1007-1020, April.
- Ruiyang Hao & Bingyu Lu & Ying Cheng & Xiu Li & Biqing Huang, 2021. "A steel surface defect inspection approach towards smart industrial monitoring," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 1833-1843, October.
- Aslı Çelik & Ayhan Küçükmanisa & Aydın Sümer & Aysun Taşyapı Çelebi & Oğuzhan Urhan, 2022. "A real-time defective pixel detection system for LCDs using deep learning based object detectors," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 985-994, April.
- Chia-Yu Hsu & Wei-Chen Liu, 2021. "Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 32(3), pages 823-836, March.
- Shuo Meng & Ruru Pan & Weidong Gao & Jian Zhou & Jingan Wang & Wentao He, 2021. "A multi-task and multi-scale convolutional neural network for automatic recognition of woven fabric pattern," Journal of Intelligent Manufacturing, Springer, vol. 32(4), pages 1147-1161, April.
- Tobias Schlosser & Michael Friedrich & Frederik Beuth & Danny Kowerko, 2022. "Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1099-1123, April.
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Keywords
Visual defect detection; Large-scale variation; Hierarchical convolution representation; Multi-scale information embedding; Hierarchical multi-scale network; Object detection;All these keywords.
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