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Hierarchical multi-scale network for cross-scale visual defect detection

Author

Listed:
  • Ruining Tang

    (Zhejiang University)

  • Zhenyu Liu

    (Zhejiang University)

  • Yiguo Song

    (Zhejiang University)

  • Guifang Duan

    (Zhejiang University)

  • Jianrong Tan

    (Zhejiang University)

Abstract

Nowadays, an increasing number of researchers apply deep-learning-based object detection methods to implement visual defect detection in industrial manufacturing. However, large-scale variation in visual defect detection impedes the improvement of detection accuracy to be further explored. Therefore, we propose a hierarchical multi-scale block (HMS-Block), equipped with hierarchical representation and multi-scale embedding, to afford scale-abundant features to facilitate multi-scale defect detection. Specially, the hierarchical representation is implemented by a cascade learning stage to extract features from local to global at the channel level. Based on this representation, a cross-branch shortcut is concisely embedded to relieve the large-scale variation problem. Ultimately, the hierarchical multi-scale network (HMSNet) is published elegantly via stacking a certain amount of HMS-Blocks. The proposed methods facilitate the defect detection at all scales and outperform the ResNet50 baseline by a large margin with minor time overhead and less parameter required, indicating that the proposed HMS-Block has a high practical utility in the field of industrial applications. Moreover, the proposed HMSNet can also be applied to other detection-based tasks and greatly surpasses existing methods. Concretely, the proposed HMSNets achieve 42.4/42.7 mAP on NEU and COCO datasets, surpassing the recent backbones (i.e., HRNetV2) by 2.6/1.2 mAP.

Suggested Citation

  • Ruining Tang & Zhenyu Liu & Yiguo Song & Guifang Duan & Jianrong Tan, 2024. "Hierarchical multi-scale network for cross-scale visual defect detection," Journal of Intelligent Manufacturing, Springer, vol. 35(3), pages 1141-1157, March.
  • Handle: RePEc:spr:joinma:v:35:y:2024:i:3:d:10.1007_s10845-023-02097-1
    DOI: 10.1007/s10845-023-02097-1
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    References listed on IDEAS

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    1. Ruizhen Liu & Zhiyi Sun & Anhong Wang & Kai Yang & Yin Wang & Qianlai Sun, 2020. "Real-time defect detection network for polarizer based on deep learning," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1813-1823, December.
    2. Saksham Jain & Gautam Seth & Arpit Paruthi & Umang Soni & Girish Kumar, 2022. "Synthetic data augmentation for surface defect detection and classification using deep learning," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1007-1020, April.
    3. Ruiyang Hao & Bingyu Lu & Ying Cheng & Xiu Li & Biqing Huang, 2021. "A steel surface defect inspection approach towards smart industrial monitoring," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 1833-1843, October.
    4. Aslı Çelik & Ayhan Küçükmanisa & Aydın Sümer & Aysun Taşyapı Çelebi & Oğuzhan Urhan, 2022. "A real-time defective pixel detection system for LCDs using deep learning based object detectors," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 985-994, April.
    5. Chia-Yu Hsu & Wei-Chen Liu, 2021. "Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 32(3), pages 823-836, March.
    6. Shuo Meng & Ruru Pan & Weidong Gao & Jian Zhou & Jingan Wang & Wentao He, 2021. "A multi-task and multi-scale convolutional neural network for automatic recognition of woven fabric pattern," Journal of Intelligent Manufacturing, Springer, vol. 32(4), pages 1147-1161, April.
    7. Tobias Schlosser & Michael Friedrich & Frederik Beuth & Danny Kowerko, 2022. "Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1099-1123, April.
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