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A study on stochastic degradation process models under different types of failure Thresholds

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  • Dong, Qinglai
  • Cui, Lirong

Abstract

Stochastic degradation process models are developed in terms of cumulative degradation signals of systems under three types of thresholds including alarm line and two different failure thresholds. One of the failure thresholds corresponds to the degradation amount, and the other corresponds to the duration. We assume that the degradation process can be separated into two distinctive stages by a change-point which is the first passage time of the degradation process with respect to the alarm line. For simplicity, the first stage is regarded as an age-dependent (or non-stationary) Wiener process or an age-dependent (or non-stationary) Gamma process, and the second stage is regarded as an age-dependent (or non-stationary) Gamma process; thus, two special degradation models, Wiener-Gamma and Gamma-Gamma, are constructed. Specially, two-stage stationary Wiener-Gamma and Gamma-Gamma models can be viewed as special cases. The system reliability is defined as the probability that the degradation signals do not exceed a failure threshold and the duration of exceeding the alarm line is less than the duration threshold. Some reliability results including two cases in terms of duration thresholds (constants and random variables) are derived. The moments of lifetime are also given based on the results. In addition, simulation is carried out to verify the given results. And some numerical examples are presented to illustrate the results obtained in the paper.

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  • Dong, Qinglai & Cui, Lirong, 2019. "A study on stochastic degradation process models under different types of failure Thresholds," Reliability Engineering and System Safety, Elsevier, vol. 181(C), pages 202-212.
    • Handle: RePEc:eee:reensy:v:181:y:2019:i:c:p:202-212
    DOI: 10.1016/j.ress.2018.10.002
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