Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing
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DOI: 10.1016/j.ress.2015.05.011
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Cited by:
- Jianyu Xu & Qingpei Hu & Dan Yu & Min Xie, 2017. "Reliability demonstration test for load-sharing systems with exponential and Weibull components," PLOS ONE, Public Library of Science, vol. 12(12), pages 1-19, December.
- Wang, Xiaofei & Wang, Bing Xing & Hong, Yili & Jiang, Pei Hua, 2021. "Degradation data analysis based on gamma process with random effects," European Journal of Operational Research, Elsevier, vol. 292(3), pages 1200-1208.
- Wang, Huan & Wang, Guan-jun & Duan, Feng-jun, 2016. "Planning of step-stress accelerated degradation test based on the inverse Gaussian process," Reliability Engineering and System Safety, Elsevier, vol. 154(C), pages 97-105.
- Sun, Bo & Fan, Xuejun & Ye, Huaiyu & Fan, Jiajie & Qian, Cheng & van Driel, Williem & Zhang, Guoqi, 2017. "A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation," Reliability Engineering and System Safety, Elsevier, vol. 163(C), pages 14-21.
- Zheng, Huiling & Yang, Jun & Xu, Houbao & Zhao, Yu, 2023. "Reliability acceptance sampling plan for degraded products subject to Wiener process with unit heterogeneity," Reliability Engineering and System Safety, Elsevier, vol. 229(C).
- Yaping Li & Enrico Zio & Ershun Pan, 2021. "An MEWMA-based segmental multivariate hidden Markov model for degradation assessment and prediction," Journal of Risk and Reliability, , vol. 235(5), pages 831-844, October.
- Woo, Seong-woo & Pecht, Michael & O'Neal, Dennis L., 2020. "Reliability design and case study of the domestic compressor subjected to repetitive internal stresses," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
- Cheng, Yao & Liao, Haitao & Huang, Zhiyi, 2021. "Optimal degradation-based hybrid double-stage acceptance sampling plan for a heterogeneous product," Reliability Engineering and System Safety, Elsevier, vol. 210(C).
- Kim, Seong-Joon & Mun, Byeong Min & Bae, Suk Joo, 2019. "A cost-driven reliability demonstration plan based on accelerated degradation tests," Reliability Engineering and System Safety, Elsevier, vol. 183(C), pages 226-239.
- Sun, Bo & Fan, Xuejun & van Driel, Willem & Cui, Chengqiang & Zhang, Guoqi, 2018. "A stochastic process based reliability prediction method for LED driver," Reliability Engineering and System Safety, Elsevier, vol. 178(C), pages 140-146.
- Dong, Qinglai & Cui, Lirong, 2019. "A study on stochastic degradation process models under different types of failure Thresholds," Reliability Engineering and System Safety, Elsevier, vol. 181(C), pages 202-212.
- Huang, Jianlin & Golubović, Dušan S & Koh, Sau & Yang, Daoguo & Li, Xiupeng & Fan, Xuejun & Zhang, G.Q., 2016. "Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test," Reliability Engineering and System Safety, Elsevier, vol. 154(C), pages 152-159.
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Keywords
Reliability demonstration; Accelerated degradation testing; Degradation; Gamma process; Optimal test plan;All these keywords.
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