Licensing or not licensing? An empirical analysis of the strategic use of patents by Japanese firms
This paper is a first attempt to analyze IP strategy of Japanese firms, by using large datasets from the Japan Patent Office's (JPO), called "Survey of Intellectual Property Activities (SIPA)." Descriptive regressions of IP strategy indicators suggest a non-linear relationship between firm size and licensing propensity. Small firms with fewer complementary assets, such as production facilities and marketing channels, tend to license more. At the same time, the licensing propensity of large firms is also high due to the effects of cross-licensing.
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- Arora, Ashish & Fosfuri, Andrea, 2003.
"Licensing the market for technology,"
Journal of Economic Behavior & Organization,
Elsevier, vol. 52(2), pages 277-295, October.
- Ashish Arora & Andréa Fosfuri, 2000. "The Market for Technology in the Chemical Industry : Causes and Consequences," Revue d'Économie Industrielle, Programme National Persée, vol. 92(1), pages 317-334.
- Lanjouw, Jean O & Schankerman, Mark, 2001. "Characteristics of Patent Litigation: A Window on Competition," RAND Journal of Economics, The RAND Corporation, vol. 32(1), pages 129-51, Spring.
- Arora, Ashish, 1997.
"Patents, licensing, and market structure in the chemical industry,"
Elsevier, vol. 26(4-5), pages 391-403, December.
- Ashish Arora, 1996. "Patents, Licensing, And Market Structure In The Chemical Industry," Industrial Organization 9605003, EconWPA.
- Kazuyuki Motohashi, 2003. "Japan's Patent System and Business Innovation: Reassessing Pro-patent Policies," Discussion papers 03020, Research Institute of Economy, Trade and Industry (RIETI).
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