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A second order approach to analyse spatial point patterns with functional marks


  • C. Comas


  • P. Delicado
  • J. Mateu


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Suggested Citation

  • C. Comas & P. Delicado & J. Mateu, 2011. "A second order approach to analyse spatial point patterns with functional marks," TEST: An Official Journal of the Spanish Society of Statistics and Operations Research, Springer;Sociedad de Estadística e Investigación Operativa, vol. 20(3), pages 503-523, November.
  • Handle: RePEc:spr:testjl:v:20:y:2011:i:3:p:503-523 DOI: 10.1007/s11749-010-0215-1

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    References listed on IDEAS

    1. Martin Schlather & Paulo J. Ribeiro & Peter J. Diggle, 2004. "Detecting dependence between marks and locations of marked point processes," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 66(1), pages 79-93.
    2. Renshaw, Eric & Mateu, Jorge & Saura, Fuensanta, 2007. "Disentangling mark/point interaction in marked-point processes," Computational Statistics & Data Analysis, Elsevier, vol. 51(6), pages 3123-3144, March.
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    1. repec:spr:alstar:v:102:y:2018:i:1:d:10.1007_s10182-016-0280-1 is not listed on IDEAS


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