A second order approach to analyse spatial point patterns with functional marks
No abstract is available for this item.
Volume (Year): 20 (2011)
Issue (Month): 3 (November)
|Contact details of provider:|| Web page: http://www.springerlink.com/link.asp?id=120411|
|Order Information:||Web: http://link.springer.de/orders.htm|
Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile, click on "citations" and make appropriate adjustments.:
- Martin Schlather & Paulo J. Ribeiro & Peter J. Diggle, 2004. "Detecting dependence between marks and locations of marked point processes," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 66(1), pages 79-93.
- Renshaw, Eric & Mateu, Jorge & Saura, Fuensanta, 2007. "Disentangling mark/point interaction in marked-point processes," Computational Statistics & Data Analysis, Elsevier, vol. 51(6), pages 3123-3144, March.
When requesting a correction, please mention this item's handle: RePEc:spr:testjl:v:20:y:2011:i:3:p:503-523. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Guenther Eichhorn)or (Christopher F Baum)
If references are entirely missing, you can add them using this form.