Causal deep learning for explainable vision-based quality inspection under visual interference
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DOI: 10.1007/s10845-023-02297-9
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- Yanning Sun & Wei Qin & Zilong Zhuang, 2022. "Nonparametric-copula-entropy and network deconvolution method for causal discovery in complex manufacturing systems," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1699-1713, August.
- Minyoung Lee & Joohyoung Jeon & Hongchul Lee, 2022. "Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT–LCD panels," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1747-1759, August.
- Yanning Sun & Wei Qin & Zilong Zhuang & Hongwei Xu, 2021. "An adaptive fault detection and root-cause analysis scheme for complex industrial processes using moving window KPCA and information geometric causal inference," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 2007-2021, October.
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Keywords
Computer vision; Defect inspection; Deep learning; Causal inference; Explainable artificial intelligence;All these keywords.
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