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Reliability analysis of dependent competing failure processes with time-varying δ shock model

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  • Lyu, Hao
  • Qu, Hongchen
  • Yang, Zaiyou
  • Ma, Li
  • Lu, Bing
  • Pecht, Michael

Abstract

The dependent competing failure process model has received increasing research attention in recent years due to its essential role in describing system reliability. For the δ shock model, as a main type of shock in dependent competing failure process, the system fails if the interval of time between two sequential shocks is less than a threshold δ. As the operation of systems, the aging effect will gradually increase. Thus, systems affected by shocks need more time to recover from damages. In the time-varying δ shock model, if damage shocks occur, the degradation rate and δ value will change multiple times simultaneously. Three failure processes consisting of a soft process induced by a degradation process and two sudden failure processes due to random shocks. Sudden failure processes include fatal shocks and damaged shocks. Damaged shocks affect systems in three different ways: (1) impacting systems by causing the degradation increment, (2) increasing the degradation rate of systems, and (3) impairing systems’ performance by increasing the δ value. A real-world example of a microelectromechanical system is presented to show the applicability of the reliability model. Sensitivity analysis is evaluated to demonstrate how parameters affect reliability.

Suggested Citation

  • Lyu, Hao & Qu, Hongchen & Yang, Zaiyou & Ma, Li & Lu, Bing & Pecht, Michael, 2023. "Reliability analysis of dependent competing failure processes with time-varying δ shock model," Reliability Engineering and System Safety, Elsevier, vol. 229(C).
  • Handle: RePEc:eee:reensy:v:229:y:2023:i:c:s0951832022004938
    DOI: 10.1016/j.ress.2022.108876
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    References listed on IDEAS

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    2. Eryilmaz, Serkan & Unlu, Kamil Demirberk, 2023. "A new generalized δ-shock model and its application to 1-out-of-(m+1):G cold standby system," Reliability Engineering and System Safety, Elsevier, vol. 234(C).
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