Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk
This paper attempts to develop a sampling inspection scheme by variables based on process performance index for product acceptance determination, which examines the situation where resampling is permitted on lots not accepted on original inspection. The equations for plan parameters, the required sample size and the corresponding critical value, are derived based on the exact sampling distribution rather than an approximation approach hence the decisions made are more accurate and reliable. Moreover, the efficiency of the proposed variables resubmitted sampling plan is evaluated and compared with the existing variables single sampling plan. For illustrative purpose, an example is presented to demonstrate the use of the derived results for making a decision on product acceptance determination.
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Volume (Year): 217 (2012)
Issue (Month): 3 ()
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- Pearn, W.L. & Wu, Chien-Wei, 2007. "An effective decision making method for product acceptance," Omega, Elsevier, vol. 35(1), pages 12-21, February.
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- Wu, Chien-Wei & Pearn, W.L., 2008. "A variables sampling plan based on Cpmk for product acceptance determination," European Journal of Operational Research, Elsevier, vol. 184(2), pages 549-560, January.
- Seo, J.H. & Jung, M. & Kim, C.M., 2009. "Design of accelerated life test sampling plans with a nonconstant shape parameter," European Journal of Operational Research, Elsevier, vol. 197(2), pages 659-666, September.
- Balamurali, S. & Jun, Chi-Hyuck, 2007. "Multiple dependent state sampling plans for lot acceptance based on measurement data," European Journal of Operational Research, Elsevier, vol. 180(3), pages 1221-1230, August.
- Wu, Chien-Wei & Pearn, W.L. & Kotz, Samuel, 2009. "An overview of theory and practice on process capability indices for quality assurance," International Journal of Production Economics, Elsevier, vol. 117(2), pages 338-359, February.
- Pearn, W.L. & Wu, Chien-Wei, 2006. "Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives," Omega, Elsevier, vol. 34(1), pages 90-101, January.
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