A Bayesian semiparametric regression model for reliability data using effective age
A new regression model for recurrent events from repairable systems is proposed. The effectiveness of each repair in Kijima models I and II is regressed on repair-specific covariates. By modeling effective age in a flexible way, the model allows a spectrum of heterogeneous repairs besides “good as new” and “good as old” repairs. The density for the baseline hazard is modeled nonparametrically with a tailfree process prior which is centered at Weibull and yet allows substantial data-driven deviations from the centering family. Linearity in the predictors is relaxed using a B-spline transformation. The method is illustrated using simulations as well as two real data analyses.
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- A. Jara & T. E. Hanson, 2011. "A class of mixtures of dependent tail-free processes," Biometrika, Biometrika Trust, vol. 98(3), pages 553-566.
- Ishwaran, Hemant & James, Lancelot F., 2004. "Computational Methods for Multiplicative Intensity Models Using Weighted Gamma Processes: Proportional Hazards, Marked Point Processes, and Panel Count Data," Journal of the American Statistical Association, American Statistical Association, vol. 99, pages 175-190, January.
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