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A Bayesian semiparametric regression model for reliability data using effective age

  • Li, Li
  • Hanson, Timothy E.
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    A new regression model for recurrent events from repairable systems is proposed. The effectiveness of each repair in Kijima models I and II is regressed on repair-specific covariates. By modeling effective age in a flexible way, the model allows a spectrum of heterogeneous repairs besides “good as new” and “good as old” repairs. The density for the baseline hazard is modeled nonparametrically with a tailfree process prior which is centered at Weibull and yet allows substantial data-driven deviations from the centering family. Linearity in the predictors is relaxed using a B-spline transformation. The method is illustrated using simulations as well as two real data analyses.

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    File URL: http://www.sciencedirect.com/science/article/pii/S0167947313004532
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    Article provided by Elsevier in its journal Computational Statistics & Data Analysis.

    Volume (Year): 73 (2014)
    Issue (Month): C ()
    Pages: 177-188

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    Handle: RePEc:eee:csdana:v:73:y:2014:i:c:p:177-188
    Contact details of provider: Web page: http://www.elsevier.com/locate/csda

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    1. Hanson, Timothy E., 2006. "Inference for Mixtures of Finite Polya Tree Models," Journal of the American Statistical Association, American Statistical Association, vol. 101, pages 1548-1565, December.
    2. Ishwaran, Hemant & James, Lancelot F., 2004. "Computational Methods for Multiplicative Intensity Models Using Weighted Gamma Processes: Proportional Hazards, Marked Point Processes, and Panel Count Data," Journal of the American Statistical Association, American Statistical Association, vol. 99, pages 175-190, January.
    3. David J. Spiegelhalter & Nicola G. Best & Bradley P. Carlin & Angelika van der Linde, 2002. "Bayesian measures of model complexity and fit," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 64(4), pages 583-639.
    4. A. Jara & T. E. Hanson, 2011. "A class of mixtures of dependent tail-free processes," Biometrika, Biometrika Trust, vol. 98(3), pages 553-566.
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