Patent Quality: Towards a Systematic Framework for Analysis and Measurement
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DOI: 10.1016/j.respol.2021.104215
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- Higham, Kyle & de Rassenfosse, Gaetan & Jaffe, Adam B, 2020. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," SocArXiv 49qxk, Center for Open Science.
- Kyle W. Higham & Gaétan de Rassenfosse & Adam B. Jaffe, 2020. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," NBER Working Papers 27598, National Bureau of Economic Research, Inc.
- Kyle Higham & Gaetan de Rassenfosse & Adam Jaffe, 2021. "Patent quality: Towards a Systematic Framework for Analysis and Measurement," Working Papers 14, Chair of Science, Technology, and Innovation Policy.
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More about this item
Keywords
patents; patent quality; patent value; patent citations; patent policy; technological impact;All these keywords.
JEL classification:
- O30 - Economic Development, Innovation, Technological Change, and Growth - - Innovation; Research and Development; Technological Change; Intellectual Property Rights - - - General
- O34 - Economic Development, Innovation, Technological Change, and Growth - - Innovation; Research and Development; Technological Change; Intellectual Property Rights - - - Intellectual Property and Intellectual Capital
Statistics
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