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Measuring Patent Quality: Indicators of Technological and Economic Value

Author

Listed:
  • Mariagrazia Squicciarini

    (OECD)

  • Hélène Dernis

    (OECD)

  • Chiara Criscuolo

    (OECD)

Abstract

This work contributes to the definition and measurement of patent quality. It proposes a wide array of indicators capturing the technological and economic value of patented inventions, and the possible impact that these might have on subsequent technological developments. The measures proposed build extensively upon recent literature, rely on information contained in the patent documents, and are calculated on patent cohorts defined by the combination of the technology field and the year of filing of patents. This is done to account for possible time- and technology-related shocks. The description of the indicators is accompanied by statistics compiled on patents from the European Patent Office, as well as tests aimed at addressing the sensitivity of the measures to alternative specifications and the correlations that may exist among them. The indicators proposed, which can be constructed on all patents, have the advantage of relying on a homogeneous set of information and of being comparable across countries and over time. To facilitate their compilation on data from other Intellectual Property (IP) offices, the SQL-based program codes used to calculate the indicators are also supplied. The paper is further accompanied by a dataset – to be obtained upon request – containing the indicators calculated on EPO patent documents published during the period 1978-2012, as well as some cohort specific statistics (i.e. main moments and key percentiles). Evaluer la qualité des brevets : Des indicateurs de valeur technologique et économique Ce travail apporte une contribution à la définition et à l’évaluation de la qualité des brevets. Le large éventail d’indicateurs proposé vise à saisir la valeur des inventions brevetées, au niveau technologique comme au niveau économique, et à estimer l’impact potentiel de ces inventions sur les développements technologiques ultérieurs. Ces mesures reposent principalement sur des travaux récents dans le domaine et exploitent l’information disponible dans les documents brevets. Pour tenir compte de possibles effets temporels et technologiques, les indicateurs sont calculés par cohortes, définies par l’année de dépôt de la demande de brevet et le domaine technologique auquel celle-ci se réfère. La description de chaque indicateur s’accompagne de statistiques établies sur les brevets déposés auprès de l’Office Européen des Brevets (OEB). S’ensuivent des tests évaluant la sensibilité des définitions à différentes spécifications et leur corrélation entre elles. Les indicateurs présentés ici peuvent être construits pour tout document de brevet. Ils ont pour avantages de reposer sur un ensemble d’information homogène et d’être comparables entre pays et dans le temps. Le code des programmes SQL développés pour le calcul des indicateurs est également détaillé, afin de faciliter la compilation de ces indicateurs sur des données d’autres bureaux de propriété intellectuelle. En parallèle, les indicateurs finaux sont mis à disposition des utilisateurs, à la demande, pour l’ensemble des brevets OEB publiés entre 1978 et 2012, ainsi que des statistiques agrégées par cohortes (i.e. principaux moments et centiles).

Suggested Citation

  • Mariagrazia Squicciarini & Hélène Dernis & Chiara Criscuolo, 2013. "Measuring Patent Quality: Indicators of Technological and Economic Value," OECD Science, Technology and Industry Working Papers 2013/3, OECD Publishing.
  • Handle: RePEc:oec:stiaaa:2013/3-en
    DOI: 10.1787/5k4522wkw1r8-en
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