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Impact of Patent Scope on subsequent Inventions: Findings from a new Measure

Listed author(s):
  • OKADA, Yoshimi
  • NAITO, Yusuke
  • NAGAOKA, Sadao

While patent scope defined by patent claims provides crucial information on the contribution of underlying inventions to the state of the art, its existing measures do not seem to appropriately capture it, especially with respect to the generality of the inventive concept. This study investigates how significantly the breadth of the first claim can predict the patent's knowledge impact on subsequent inventions in complex and discrete technologies using the inverse of the first claim length as the indicator. There are two major findings. First, this indicator has very significant predictive power for the knowledge impact of the underlying invention as measured by applicant forward citations, controlling for two existing indicators of patent scope (the number of patent claims and the number of different patent classification codes assigned) in both technology areas. Second, its predictive power for the incidence of top-ranked patents increases in higher quantiles in the complex but not the discrete technology area, unlike the other indicators. This is consistent with an economic model predicting that the knowledge impact of an invention with broad scope has a high variance, depending on the emergence of complementary inventions that enhance the impact of the initial invention.

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File URL: http://hermes-ir.lib.hit-u.ac.jp/rs/bitstream/10086/28514/1/070iirWP17-03.pdf
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Paper provided by Institute of Innovation Research, Hitotsubashi University in its series IIR Working Paper with number 17-03.

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Length: 36 p.
Date of creation: Feb 2017
Handle: RePEc:hit:iirwps:17-03
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  1. Verhoeven, Dennis & Bakker, Jurriën & Veugelers, Reinhilde, 2016. "Measuring technological novelty with patent-based indicators," Research Policy, Elsevier, vol. 45(3), pages 707-723.
  2. Nerkar, Atul & Shane, Scott, 2003. "When do start-ups that exploit patented academic knowledge survive?," International Journal of Industrial Organization, Elsevier, vol. 21(9), pages 1391-1410, November.
  3. Giuri, Paola & Mariani, Myriam & Brusoni, Stefano & Crespi, Gustavo & Francoz, Dominique & Gambardella, Alfonso & Garcia-Fontes, Walter & Geuna, Aldo & Gonzales, Raul & Harhoff, Dietmar & Hoisl, Karin, 2007. "Inventors and invention processes in Europe: Results from the PatVal-EU survey," Research Policy, Elsevier, vol. 36(8), pages 1107-1127, October.
  4. Manuel Trajtenberg & Adam B. Jaffe & Michael S. Fogarty, 2000. "Knowledge Spillovers and Patent Citations: Evidence from a Survey of Inventors," American Economic Review, American Economic Association, vol. 90(2), pages 215-218, May.
  5. Scherer, F. M. & Harhoff, Dietmar, 2000. "Technology policy for a world of skew-distributed outcomes," Research Policy, Elsevier, vol. 29(4-5), pages 559-566, April.
  6. Elizabeth Webster & Paul H. Jensen & Alfons Palangkaraya, 2014. "Patent examination outcomes and the national treatment principle," RAND Journal of Economics, RAND Corporation, vol. 45(2), pages 449-469, June.
  7. Novelli, Elena, 2015. "An examination of the antecedents and implications of patent scope," Research Policy, Elsevier, vol. 44(2), pages 493-507.
  8. Jean O. Lanjouw & Mark Schankerman, 2004. "Patent Quality and Research Productivity: Measuring Innovation with Multiple Indicators," Economic Journal, Royal Economic Society, vol. 114(495), pages 441-465, 04.
  9. Mariagrazia Squicciarini & Hélène Dernis & Chiara Criscuolo, 2013. "Measuring Patent Quality: Indicators of Technological and Economic Value," OECD Science, Technology and Industry Working Papers 2013/3, OECD Publishing.
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