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Statistical analysis using multiple censoring scheme under partially accelerated life tests for the power Lindley distribution

Author

Listed:
  • Intekhab Alam

    (Maharishi University of Information Technology)

  • Mustafa Kamal

    (Saudi Electronic University)

  • Ahmadur Rahman

    (Aligarh Muslim University)

  • Trapty Agarwal

    (Maharishi University of Information Technology)

  • Awakash Mishra

    (Maharishi University of Information Technology)

Abstract

If the items are very reliable, assessing the lifetime of them in regular usage requires more time and money than in accelerated conditions. As a result, life testing studies benefit greatly from accelerated life testing (ALT) since it saves time and money. In ALT, the components are subjected to higher levels of stress than usual in order to detect early failures in a short period of time and so decrease the expenses associated with component testing while maintaining quality. In this paper, a problem-based constant stress partially accelerated life test for multiple censored data is investigated. Under normal and accelerated settings, failure data from test objects is supposed to follow the Power Lindley distribution. The maximum likelihood estimates (MLEs) are obtained by solving the likelihood equations numerically. The approximate confidence intervals for the parameters are calculated using a normal approximation to the asymptotic distribution of MLEs. A simulation study is then used to test and validate the estimators' performance.

Suggested Citation

  • Intekhab Alam & Mustafa Kamal & Ahmadur Rahman & Trapty Agarwal & Awakash Mishra, 2024. "Statistical analysis using multiple censoring scheme under partially accelerated life tests for the power Lindley distribution," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 15(7), pages 3424-3436, July.
    • Handle: RePEc:spr:ijsaem:v:15:y:2024:i:7:d:10.1007_s13198-024-02350-7
    DOI: 10.1007/s13198-024-02350-7
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    References listed on IDEAS

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    1. Ling, Li & Xu, Wei & Li, Minghai, 2009. "Parametric inference for progressive Type-I hybrid censored data on a simple step-stress accelerated life test model," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 79(10), pages 3110-3121.
    2. Morris H. Degroot & Prem K. Goel, 1979. "Bayesian estimation and optimal designs in partially accelerated life testing," Naval Research Logistics Quarterly, John Wiley & Sons, vol. 26(2), pages 223-235, June.
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