Semidefinite programming for the educational testing problem
Methods for solving the educational testing problem which arises from statistics are considered. The problem is to find lower bounds for the reliability of the total score on a test (or subtests) whose items are not parallel using data from a single test administration. We formulate the problem as an optimization problem with a linear objective function and semidefinite constraints. We maintain exact primal and dual feasibility during the course of the algorithm. The search direction is found using an inexact Gauss–Newton method rather than a Newton method on a symmetrized system. Computational results illustrating the robustness of the algorithm are successfully exploited. Copyright Springer-Verlag 2008
Volume (Year): 16 (2008)
Issue (Month): 3 (September)
|Contact details of provider:|| Web page: http://www.springer.com|
Web page: http://www.fhi.sk/ssov
Web page: http://www.mot.org.hu/index_en.html
Web page: http://nb.vse.cz/csov/english.htm
Web page: http://www.oegor.at/
Web page: http://hdoi.hr/en_US/en/
|Order Information:||Web: http://www.springer.com/business/operations+research/journal/10100|
References listed on IDEAS
Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile, click on "citations" and make appropriate adjustments.:
- Louis Guttman, 1945. "A basis for analyzing test-retest reliability," Psychometrika, Springer;The Psychometric Society, vol. 10(4), pages 255-282, December.
When requesting a correction, please mention this item's handle: RePEc:spr:cejnor:v:16:y:2008:i:3:p:239-249. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Sonal Shukla)or (Rebekah McClure)
If references are entirely missing, you can add them using this form.