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A class of multi-sample nonparametric tests for panel count data


  • N. Balakrishnan


  • Xingqiu Zhao



No abstract is available for this item.

Suggested Citation

  • N. Balakrishnan & Xingqiu Zhao, 2011. "A class of multi-sample nonparametric tests for panel count data," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 63(1), pages 135-156, February.
  • Handle: RePEc:spr:aistmt:v:63:y:2011:i:1:p:135-156 DOI: 10.1007/s10463-008-0209-x

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    References listed on IDEAS

    1. Jianguo Sun, 2003. "A nonparametric test for panel count data," Biometrika, Biometrika Trust, vol. 90(1), pages 199-208, March.
    2. X. Joan Hu & Jianguo Sun & Lee-Jen Wei, 2003. "Regression Parameter Estimation from Panel Counts," Scandinavian Journal of Statistics, Danish Society for Theoretical Statistics;Finnish Statistical Society;Norwegian Statistical Association;Swedish Statistical Association, vol. 30(1), pages 25-43.
    3. J. Sun & L. J. Wei, 2000. "Regression analysis of panel count data with covariate-dependent observation and censoring times," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 62(2), pages 293-302.
    4. Ying Zhang, 2002. "A semiparametric pseudolikelihood estimation method for panel count data," Biometrika, Biometrika Trust, vol. 89(1), pages 39-48, March.
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    Cited by:

    1. Li, Yang & Zhao, Hui & Sun, Jianguo & Kim, KyungMann, 2014. "Nonparametric tests for panel count data with unequal observation processes," Computational Statistics & Data Analysis, Elsevier, vol. 73(C), pages 103-111.
    2. Zhang, Haixiang & Zhao, Hui & Sun, Jianguo & Wang, Dehui & Kim, KyungMann, 2013. "Regression analysis of multivariate panel count data with an informative observation process," Journal of Multivariate Analysis, Elsevier, vol. 119(C), pages 71-80.
    3. repec:spr:lifeda:v:23:y:2017:i:4:d:10.1007_s10985-016-9375-y is not listed on IDEAS
    4. Jie Zhou & Haixiang Zhang & Liuquan Sun & Jianguo Sun, 0. "Joint analysis of panel count data with an informative observation process and a dependent terminal event," Lifetime Data Analysis: An International Journal Devoted to Statistical Methods and Applications for Time-to-Event Data, Springer, vol. 0, pages 1-25.


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