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Unraveling the dynamics of conductive filaments in MoS2-based memristors by operando transmission electron microscopy

Author

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  • Ke Ran

    (AMO GmbH
    RWTH Aachen University
    Forschungszentrum Jülich GmbH)

  • Janghyun Jo

    (Forschungszentrum Jülich GmbH)

  • Sofía Cruces

    (RWTH Aachen University)

  • Zhenxing Wang

    (AMO GmbH)

  • Rafal E. Dunin-Borkowski

    (Forschungszentrum Jülich GmbH)

  • Joachim Mayer

    (RWTH Aachen University
    Forschungszentrum Jülich GmbH)

  • Max C. Lemme

    (AMO GmbH
    RWTH Aachen University)

Abstract

Advanced operando transmission electron microscopy (TEM) techniques enable the observation of nanoscale phenomena in electronic devices during operation. Here, we investigated lateral memristive devices composed of two dimensional layered MoS2 with Pd and Ag electrodes. Under external bias voltage, we visualized the formation and migration of Ag conductive filaments (CFs) between the two electrodes, and their complete dissolution upon reversing the biasing polarity. The CFs exhibited a wide range of sizes, from several Ångströms to tens of nanometers, and followed diverse pathways: along the MoS2 surfaces, within the van der Waals gap between MoS2 layers, and through the spacing between MoS2 bundles. Our method enables correlation between current-voltage responses and real-time TEM imaging, offering insights into failed and anomalous switching behaviors, and clarifying the cycle-to-cycle variabilities. Our findings provide solid evidence for the electrochemical metallization mechanism, elucidate the formation dynamics of CFs, and reveal key parameters influencing the switching performance.

Suggested Citation

  • Ke Ran & Janghyun Jo & Sofía Cruces & Zhenxing Wang & Rafal E. Dunin-Borkowski & Joachim Mayer & Max C. Lemme, 2025. "Unraveling the dynamics of conductive filaments in MoS2-based memristors by operando transmission electron microscopy," Nature Communications, Nature, vol. 16(1), pages 1-10, December.
    • Handle: RePEc:nat:natcom:v:16:y:2025:i:1:d:10.1038_s41467-025-62592-2
    DOI: 10.1038/s41467-025-62592-2
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    1. Ying Zhang & Ge-Qi Mao & Xiaolong Zhao & Yu Li & Meiyun Zhang & Zuheng Wu & Wei Wu & Huajun Sun & Yizhong Guo & Lihua Wang & Xumeng Zhang & Qi Liu & Hangbing Lv & Kan-Hao Xue & Guangwei Xu & Xiangshui, 2021. "Evolution of the conductive filament system in HfO2-based memristors observed by direct atomic-scale imaging," Nature Communications, Nature, vol. 12(1), pages 1-10, December.
    2. Yuchao Yang & Peng Gao & Linze Li & Xiaoqing Pan & Stefan Tappertzhofen & ShinHyun Choi & Rainer Waser & Ilia Valov & Wei D. Lu, 2014. "Electrochemical dynamics of nanoscale metallic inclusions in dielectrics," Nature Communications, Nature, vol. 5(1), pages 1-9, September.
    3. Wen Sun & Bin Gao & Miaofang Chi & Qiangfei Xia & J. Joshua Yang & He Qian & Huaqiang Wu, 2019. "Understanding memristive switching via in situ characterization and device modeling," Nature Communications, Nature, vol. 10(1), pages 1-13, December.
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