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Degradation Evaluation Method with a Test Device for Aging Diagnosis in PV Modules

Author

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  • Jian Shen

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Byeong-Gill Han

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Ji-Myung Kim

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Sung-Moon Choi

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Kyung-Hwa Kim

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Hu-Dong Lee

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Dong-Hyun Tae

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

  • Dae-Seok Rho

    (Department of Electrical Engineering, Korea University of Technology & Education, Cheonan 31253, Korea)

Abstract

Generally, PV (photovoltaic) modules are known as devices which are used semi-permanently for more than 20 years, but the electrical performance and lifespan of PV modules can be significantly degraded due to various environmental factors. Thus, a proper evaluation method for aging phenomenon of PV modules is required. Although there already are methods which compare adjusted PV output power based on STC (standard test condition) with initial PV module specification, or perform direct comparison by conducting the test under STC, there are issues with objectivity or efficiency in the existing evaluation method of aging phenomenon due to the data distortion while adjusting measured data or difficulties in implementation. Therefore, in order to overcome the above-mentioned disadvantage of the existing evaluation method for deterioration in PV modules and evaluate the aging characteristics of PV modules based on on-site measurement data in an accurate and efficient manner, this paper implements a test device for aging diagnosis to measure and collect actual data from a PV module section, and presents a modeling of data analysis for aging phenomenon with MATLAB S/W in order to minimize the variability of PV output, communication error, delay, etc. Furthermore, this paper confirms the usefulness of the presented test device for aging diagnosis of the PV modules which is accurately evaluated by considering on-site measurement of PV output power by season.

Suggested Citation

  • Jian Shen & Byeong-Gill Han & Ji-Myung Kim & Sung-Moon Choi & Kyung-Hwa Kim & Hu-Dong Lee & Dong-Hyun Tae & Dae-Seok Rho, 2022. "Degradation Evaluation Method with a Test Device for Aging Diagnosis in PV Modules," Energies, MDPI, vol. 15(11), pages 1-13, May.
    • Handle: RePEc:gam:jeners:v:15:y:2022:i:11:p:3851-:d:822468
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    References listed on IDEAS

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    1. Bouraiou, Ahmed & Hamouda, Messaoud & Chaker, Abdelkader & Lachtar, Salah & Neçaibia, Ammar & Boutasseta, Nadir & Mostefaoui, Mohammed, 2017. "Experimental evaluation of the performance and degradation of single crystalline silicon photovoltaic modules in the Saharan environment," Energy, Elsevier, vol. 132(C), pages 22-30.
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