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Degradation-based burn-in with preventive maintenance

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  • Ye, Zhi-Sheng
  • Shen, Yan
  • Xie, Min

Abstract

As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the screening decision on the degradation level of a burnt-in unit. Motivated by the infant mortality faced by many Micro-Electro-Mechanical Systems (MEMSs), this study develops two degradation-based joint burn-in and maintenance models under the age and the block based maintenances, respectively. We assume that the product population comprises a weak and a normal subpopulations. Degradation of the product follows Wiener processes with linear drift, while the weak and the normal subpopulations possess distinct drift parameters. The objective of joint burn-in and maintenance decisions is to minimize the long run average cost per unit time during field use by properly choosing the burn-in settings and the preventive replacement intervals. An example using the MEMS devices demonstrates effectiveness of these two models.

Suggested Citation

  • Ye, Zhi-Sheng & Shen, Yan & Xie, Min, 2012. "Degradation-based burn-in with preventive maintenance," European Journal of Operational Research, Elsevier, vol. 221(2), pages 360-367.
    • Handle: RePEc:eee:ejores:v:221:y:2012:i:2:p:360-367
    DOI: 10.1016/j.ejor.2012.03.028
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    References listed on IDEAS

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