Optimal burn-in for maximizing reliability of repairable non-series systems
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
References listed on IDEAS
- Chang, Dong Shang, 2000. "Optimal burn-in decision for products with an unimodal failure rate function," European Journal of Operational Research, Elsevier, vol. 126(3), pages 534-540, November.
- Sheu, Shey-Huei & Chien, Yu-Hung, 2005. "Optimal burn-in time to minimize the cost for general repairable products sold under warranty," European Journal of Operational Research, Elsevier, vol. 163(2), pages 445-461, June.
CitationsCitations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
- repec:eee:reensy:v:150:y:2016:i:c:p:126-135 is not listed on IDEAS
- Cha, Ji Hwan & Finkelstein, Maxim, 2010. "Burn-in by environmental shocks for two ordered subpopulations," European Journal of Operational Research, Elsevier, vol. 206(1), pages 111-117, October.
- Cha, Ji Hwan & Pulcini, Gianpaolo, 2016. "Optimal burn-in procedure for mixed populations based on the device degradation process history," European Journal of Operational Research, Elsevier, vol. 251(3), pages 988-998.
- Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.
- repec:eee:reensy:v:139:y:2015:i:c:p:149-155 is not listed on IDEAS
- Si, Xiao-Sheng & Wang, Wenbin & Hu, Chang-Hua & Zhou, Dong-Hua, 2011. "Remaining useful life estimation - A review on the statistical data driven approaches," European Journal of Operational Research, Elsevier, vol. 213(1), pages 1-14, August.
- Mohammadi, Faezeh & Izadi, Muhyiddin & Lai, Chin-Diew, 2016. "On testing whether burn-in is required under the long-run average cost," Statistics & Probability Letters, Elsevier, vol. 110(C), pages 217-224.
More about this item
KeywordsFailure rate Infant mortality failures Minimal repair;
StatisticsAccess and download statistics
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:ejores:v:193:y:2009:i:1:p:140-151. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Dana Niculescu). General contact details of provider: http://www.elsevier.com/locate/eor .
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
Please note that corrections may take a couple of weeks to filter through the various RePEc services.