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Optimal burn-in decision for products with an unimodal failure rate function

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  • Chang, Dong Shang

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  • Chang, Dong Shang, 2000. "Optimal burn-in decision for products with an unimodal failure rate function," European Journal of Operational Research, Elsevier, vol. 126(3), pages 534-540, November.
    • Handle: RePEc:eee:ejores:v:126:y:2000:i:3:p:534-540
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    Cited by:

    1. Peña-Ramírez, Fernando A. & Guerra, Renata Rojas & Canterle, Diego Ramos & Cordeiro, Gauss M., 2020. "The logistic Nadarajah–Haghighi distribution and its associated regression model for reliability applications," Reliability Engineering and System Safety, Elsevier, vol. 204(C).
    2. Kim, Kyungmee O. & Kuo, Way, 2009. "Optimal burn-in for maximizing reliability of repairable non-series systems," European Journal of Operational Research, Elsevier, vol. 193(1), pages 140-151, February.
    3. Andrzej Giniewicz & Alicja Jokiel-Rokita, 2013. "Burn-in for a time-transformed exponential model," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 76(2), pages 265-285, February.
    4. Singla, Neetu & Jain, Kanchan & Kumar Sharma, Suresh, 2012. "The Beta Generalized Weibull distribution: Properties and applications," Reliability Engineering and System Safety, Elsevier, vol. 102(C), pages 5-15.
    5. Adcock, C J & Meade, N, 2017. "Using parametric classification trees for model selection with applications to financial risk management," European Journal of Operational Research, Elsevier, vol. 259(2), pages 746-765.
    6. Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.
    7. Cha, Ji Hwan & Finkelstein, Maxim, 2011. "Burn-in and the performance quality measures in heterogeneous populations," European Journal of Operational Research, Elsevier, vol. 210(2), pages 273-280, April.

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