A Survival Analysis of the Approval of U.S. Patent Applications
AbstractWe model the length of time that it takes for a patent application to be granted by the U.S. Patent and Trademark Office, conditional on the patent actually being awarded eventually. Survival analysis is applied and both the nonparametric Kaplan-Meier and parametric accelerated failure time models are used to analyze the data. We find that the number of claims a patent makes, the number of citations a patent makes, the patent’s technological category, and the type of applicant all have significant effects on the duration that a patent is under consideration. A log-normal survival model is the preferred parametric specification, and the results suggest that the hazard function is non-monotonic over time.
Download InfoIf you experience problems downloading a file, check if you have the proper application to view it first. In case of further problems read the IDEAS help page. Note that these files are not on the IDEAS site. Please be patient as the files may be large.
Bibliographic InfoPaper provided by Department of Economics, University of Victoria in its series Econometrics Working Papers with number 0707.
Length: 23 pages
Date of creation: 24 Aug 2007
Date of revision:
Note: ISSN 1485-6441
Contact details of provider:
Postal: PO Box 1700, STN CSC, Victoria, BC, Canada, V8W 2Y2
Web page: http://web.uvic.ca/econ
More information through EDIRC
Patents; research and development; survival analysis; hazard function;
Other versions of this item:
- Ying Xie & David Giles, 2011. "A survival analysis of the approval of US patent applications," Applied Economics, Taylor & Francis Journals, Taylor & Francis Journals, vol. 43(11), pages 1375-1384.
- C16 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods and Methodology: General - - - Econometric and Statistical Methods; Specific Distributions
- C29 - Mathematical and Quantitative Methods - - Single Equation Models; Single Variables - - - Other
- C46 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods: Special Topics - - - Specific Distributions
- L10 - Industrial Organization - - Market Structure, Firm Strategy, and Market Performance - - - General
This paper has been announced in the following NEP Reports:
- NEP-ALL-2007-09-02 (All new papers)
- NEP-INO-2007-09-02 (Innovation)
- NEP-IPR-2007-09-02 (Intellectual Property Rights)
Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile, click on "citations" and make appropriate adjustments.:
- Kennan, John, 1985. "The duration of contract strikes in U.S. manufacturing," Journal of Econometrics, Elsevier, Elsevier, vol. 28(1), pages 5-28, April.
- Gupeng, Zhang & Xiangdong, Chen, 2012. "The value of invention patents in China: Country origin and technology field differences," China Economic Review, Elsevier, Elsevier, vol. 23(2), pages 357-370.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Lori Cretney).
If references are entirely missing, you can add them using this form.