A Survival Analysis of the Approval of U.S. Patent Applications
AbstractWe model the length of time that it takes for a patent application to be granted by the U.S. Patent and Trademark Office, conditional on the patent actually being awarded eventually. Survival analysis is applied and both the nonparametric Kaplan-Meier and parametric accelerated failure time models are used to analyze the data. We find that the number of claims a patent makes, the number of citations a patent makes, the patent’s technological category, and the type of applicant all have significant effects on the duration that a patent is under consideration. A log-normal survival model is the preferred parametric specification, and the results suggest that the hazard function is non-monotonic over time.
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Bibliographic InfoPaper provided by Department of Economics, University of Victoria in its series Econometrics Working Papers with number 0707.
Length: 23 pages
Date of creation: 24 Aug 2007
Date of revision:
Note: ISSN 1485-6441
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Postal: PO Box 1700, STN CSC, Victoria, BC, Canada, V8W 2Y2
Web page: http://web.uvic.ca/econ
More information through EDIRC
Patents; research and development; survival analysis; hazard function;
Other versions of this item:
- Ying Xie & David Giles, 2011. "A survival analysis of the approval of US patent applications," Applied Economics, Taylor and Francis Journals, vol. 43(11), pages 1375-1384.
- C16 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods and Methodology: General - - - Econometric and Statistical Methods; Specific Distributions
- C29 - Mathematical and Quantitative Methods - - Single Equation Models; Single Variables - - - Other
- C46 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods: Special Topics - - - Specific Distributions
- L10 - Industrial Organization - - Market Structure, Firm Strategy, and Market Performance - - - General
This paper has been announced in the following NEP Reports:
- NEP-ALL-2007-09-02 (All new papers)
- NEP-INO-2007-09-02 (Innovation)
- NEP-IPR-2007-09-02 (Intellectual Property Rights)
Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile, click on "citations" and make appropriate adjustments.:
- Kennan, John, 1985. "The duration of contract strikes in U.S. manufacturing," Journal of Econometrics, Elsevier, vol. 28(1), pages 5-28, April.
- Gupeng, Zhang & Xiangdong, Chen, 2012. "The value of invention patents in China: Country origin and technology field differences," China Economic Review, Elsevier, vol. 23(2), pages 357-370.
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