Printed from https://ideas.repec.org/s/eee/techno7.html
Content
2016, Volume 48-49
- 87-98 A new intellectual property metric for standardization activities
by Tamura, Suguru
Elsevier
Technovation
Contact information of Elsevier
Serial Information
Download restrictions: Full text for ScienceDirect subscribers only
Editor: Jonathan Linton
Series handle: RePEc:eee:techno
ISSN: 0166-4972
Citations RSS feed: at CitEc
Impact factors
- Simple (last 10 years)
- Recursive (10)
- Discounted (10)
- Recursive discounted (10)
- H-Index (10)
- Euclid (10)
- Aggregate (10)
Top item:
- By citations
- By downloads (last 12 months)
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:techno. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: http://www.sciencedirect.com/science/journal/01664972 .