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A model for step‐stress accelerated life testing

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  • A.D. Dharmadhikari
  • Md. Monsur Rahman

Abstract

Modern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing. In this paper we assume a Weibull and Lognormal model whose scale parameter depends upon the present level as well as the age at the entry in the present stress level. On the basis of that we propose a parametric model to the life distribution for step‐stress testing and suggest a suitable design to estimate the parameters involved in the model. A simulation study has been done by the proposed model based on maximum likelihood estimation. © 2003 Wiley Periodicals, Inc. Naval Research Logistics, 2003

Suggested Citation

  • A.D. Dharmadhikari & Md. Monsur Rahman, 2003. "A model for step‐stress accelerated life testing," Naval Research Logistics (NRL), John Wiley & Sons, vol. 50(8), pages 841-868, December.
    • Handle: RePEc:wly:navres:v:50:y:2003:i:8:p:841-868
    DOI: 10.1002/nav.10088
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    References listed on IDEAS

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    1. Do Sun Bai & Myung Soo Kim, 1993. "Optimum simple step‐stress accelerated life tests for weibull distribution and type I censoring," Naval Research Logistics (NRL), John Wiley & Sons, vol. 40(2), pages 193-210, March.
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