Optimal design of accelerated life testing plans under progressive censoring
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DOI: 10.1080/0740817X.2012.725504
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Cited by:
- Wu, Shuo-Jye & Huang, Syuan-Rong, 2017. "Planning two or more level constant-stress accelerated life tests with competing risks," Reliability Engineering and System Safety, Elsevier, vol. 158(C), pages 1-8.
- Liu, Yao & Wang, Yashun & Fan, Zhengwei & Bai, Guanghan & Chen, Xun, 2021. "Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes," Reliability Engineering and System Safety, Elsevier, vol. 213(C).
- Wu, Shuo-Jye & Hsu, Chu-Chun & Huang, Syuan-Rong, 2020. "Optimal designs and reliability sampling plans for one-shot devices with cost considerations," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
- Ekene Gabriel Okafor & Whit Vinson & David Ryan Huitink, 2023. "Effect of Stress Interaction on Multi-Stress Accelerated Life Test Plan: Assessment Based on Particle Swarm Optimization," Sustainability, MDPI, vol. 15(4), pages 1-26, February.
- Fariba Azizi & Firoozeh Haghighi & Elahe Ghadiri & Leila Torabi, 2017. "Statistical inference for masked interval data with Weibull distribution under simple step-stress test and tampered failure rate model," Journal of Risk and Reliability, , vol. 231(6), pages 654-665, December.
- Zhang, Hanxiao & Li, Yan-Fu, 2022. "Integrated optimization of test case selection and sequencing for reliability testing of the mainboard of Internet backbone routers," European Journal of Operational Research, Elsevier, vol. 299(1), pages 183-194.
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