A sequential order statistics approach to step-stress testing
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
References listed on IDEAS
- Erhard Cramer & Udo Kamps, 2003. "Marginal distributions of sequential and generalized order statistics," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 58(3), pages 293-310, December.
- Balakrishnan, N. & Beutner, E. & Kamps, U., 2008. "Order restricted inference for sequential k-out-of-n systems," Journal of Multivariate Analysis, Elsevier, vol. 99(7), pages 1489-1502, August.
- N. Balakrishnan & Qihao Xie & D. Kundu, 2009. "Exact inference for a simple step-stress model from the exponential distribution under time constraint," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 61(1), pages 251-274, March.
- Erhard Cramer & Udo Kamps, 2001. "Estimation with Sequential Order Statistics from Exponential Distributions," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 53(2), pages 307-324, June.
CitationsCitations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
- Stefan Bedbur & Marco Burkschat & Udo Kamps, 2016. "Inference in a model of successive failures with shape-adjusted hazard rates," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 68(3), pages 639-657, June.
- Vuong, Q.N. & Bedbur, S. & Kamps, U., 2013. "Distances between models of generalized order statistics," Journal of Multivariate Analysis, Elsevier, vol. 118(C), pages 24-36.
More about this item
KeywordsAccelerated life-testing; Step-stress experiment; Generalized order statistics; k-out-of-n system; Location-scale family of distributions; Maximum likelihood estimation; Order restricted inference;
StatisticsAccess and download statistics
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:aistmt:v:64:y:2012:i:2:p:303-318. See general information about how to correct material in RePEc.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: (Sonal Shukla) or (Rebekah McClure). General contact details of provider: http://www.springer.com .