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Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

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  • Narayanaswamy Balakrishnan
  • Elena Castilla

Abstract

We introduce here a new family of divergence-based estimators in this work for predicting the lifetimes of one-shot devices subjected to cyclic Accelerated Life-Tests (ALTs). This family, which includes the maximum likelihood estimator (MLE) as a special case, offers a robust alternative to traditional inferential procedures. We also present a family of divergence-based model selection criteria. A simulation study and a numerical example illustrate the advantages of these estimators and the robust inferential methods based on them.

Suggested Citation

  • Narayanaswamy Balakrishnan & Elena Castilla, 2025. "Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints," Journal of Risk and Reliability, , vol. 239(5), pages 900-914, October.
    • Handle: RePEc:sae:risrel:v:239:y:2025:i:5:p:900-914
    DOI: 10.1177/1748006X251314506
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