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Multivariate Process Control Chart Pattern Classification Using Multi-Channel Deep Convolutional Neural Networks

Author

Listed:
  • Chuen-Sheng Cheng

    (Department of Industrial Engineering and Management, Yuan Ze University, No. 135, Yuan-Tung Road, Chung-Li District, Taoyuan City 32003, Taiwan)

  • Pei-Wen Chen

    (Department of Industrial Engineering and Management, Yuan Ze University, No. 135, Yuan-Tung Road, Chung-Li District, Taoyuan City 32003, Taiwan)

  • Yu-Chin Hsieh

    (Department of Industrial Engineering and Management, Yuan Ze University, No. 135, Yuan-Tung Road, Chung-Li District, Taoyuan City 32003, Taiwan)

  • Yu-Tang Wu

    (Department of Industrial Engineering and Management, Yuan Ze University, No. 135, Yuan-Tung Road, Chung-Li District, Taoyuan City 32003, Taiwan)

Abstract

Statistical process control (SPC) charts are commonly used to monitor quality characteristics in manufacturing processes. When monitoring two or more related quality characteristics simultaneously, multivariate T 2 control charts are often employed. Like univariate control charts, control chart pattern recognition (CCPR) plays a crucial role in multivariate SPC. The presence of non-random patterns in T 2 control charts indicates that a process is influenced by one or more assignable causes and that corrective actions should be taken. In this study, we developed a deep learning-based classification model for recognizing control chart patterns in multivariate processes. To address the problem of the insufficient representation of one-dimensional (1D) data, we explore the advantages of using two-dimensional (2D) image data obtained from a threshold-free recurrence plot. A multi-channel deep convolutional neural network (MCDCNN) model was developed to incorporate both 1D and 2D representations of control chart data. This model was tested on multivariate processes with different covariance matrices and compared with other traditional algorithms. Moreover, the effects of imbalanced datasets and dataset size on classification performance were analyzed. Simulation studies revealed that the developed MCDCNN model outperforms other techniques in identifying multivariate non-random patterns. For the most significant one, our proposed MCDCNN method achieved a 10% improvement over traditional methods. The overall results suggest that the developed MCDCNN model can be beneficial for intelligent SPC.

Suggested Citation

  • Chuen-Sheng Cheng & Pei-Wen Chen & Yu-Chin Hsieh & Yu-Tang Wu, 2023. "Multivariate Process Control Chart Pattern Classification Using Multi-Channel Deep Convolutional Neural Networks," Mathematics, MDPI, vol. 11(15), pages 1-26, July.
  • Handle: RePEc:gam:jmathe:v:11:y:2023:i:15:p:3291-:d:1203383
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    References listed on IDEAS

    as
    1. Tao Zan & Zhihao Liu & Hui Wang & Min Wang & Xiangsheng Gao, 2020. "Control chart pattern recognition using the convolutional neural network," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 703-716, March.
    2. Charles R. Harris & K. Jarrod Millman & Stéfan J. Walt & Ralf Gommers & Pauli Virtanen & David Cournapeau & Eric Wieser & Julian Taylor & Sebastian Berg & Nathaniel J. Smith & Robert Kern & Matti Picu, 2020. "Array programming with NumPy," Nature, Nature, vol. 585(7825), pages 357-362, September.
    3. Ethel García & Rita Peñabaena-Niebles & Maria Jubiz-Diaz & Angie Perez-Tafur, 2022. "Concurrent Control Chart Pattern Recognition: A Systematic Review," Mathematics, MDPI, vol. 10(6), pages 1-31, March.
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