Gamma lifetimes and one-shot device testing analysis
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DOI: 10.1016/j.ress.2014.01.009
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References listed on IDEAS
- Balakrishnan, N. & Ling, M.H., 2012. "EM algorithm for one-shot device testing under the exponential distribution," Computational Statistics & Data Analysis, Elsevier, vol. 56(3), pages 502-509.
- Dianne M. Finkelstein & Louise M. Ryan, 1987. "Estimating Carcinogenic Potency from a Rodent Tumorigenicity Experiment," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 36(2), pages 121-133, June.
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Cited by:
- Ranjan, Rakesh & Sen, Rijji & Upadhyay, Satyanshu K., 2021. "Bayes analysis of some important lifetime models using MCMC based approaches when the observations are left truncated and right censored," Reliability Engineering and System Safety, Elsevier, vol. 214(C).
- Franko, Mitja & Nagode, Marko, 2015. "Probability density function of the equivalent stress amplitude using statistical transformation," Reliability Engineering and System Safety, Elsevier, vol. 134(C), pages 118-125.
- N. Balakrishnan & E. Castilla & N. Martín & L. Pardo, 2019. "Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 82(8), pages 991-1019, November.
- Zhu, Xiaojun & Liu, Kai & He, Mu & Balakrishnan, N., 2021. "Reliability estimation for one-shot devices under cyclic accelerated life-testing," Reliability Engineering and System Safety, Elsevier, vol. 212(C).
- Wu, Shuo-Jye & Hsu, Chu-Chun & Huang, Syuan-Rong, 2020. "Optimal designs and reliability sampling plans for one-shot devices with cost considerations," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
- Leijia Ding & Wenhao Gui, 2023. "Statistical Inference of Two Gamma Distributions under the Joint Type-II Censoring Scheme," Mathematics, MDPI, vol. 11(9), pages 1-23, April.
- Ling, M.H. & Hu, X.W., 2020. "Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
- Qin, Shuidan & Wang, Bing Xing & Wu, Wenhui & Ma, Chao, 2022. "The prediction intervals of remaining useful life based on constant stress accelerated life test data," European Journal of Operational Research, Elsevier, vol. 301(2), pages 747-755.
- Balakrishnan, N. & So, H.Y. & Ling, M.H., 2015. "EM algorithm for one-shot device testing with competing risks under exponential distribution," Reliability Engineering and System Safety, Elsevier, vol. 137(C), pages 129-140.
- Man-Ho Ling & Narayanaswamy Balakrishnan & Chenxi Yu & Hon Yiu So, 2021. "Inference for One-Shot Devices with Dependent k -Out-of- M Structured Components under Gamma Frailty," Mathematics, MDPI, vol. 9(23), pages 1-24, November.
- Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).
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More about this item
Keywords
EM algorithm; Accelerated life-test; One-shot device testing; Binary data; Gamma distribution; Asymptotic estimate; Asymptotic confidence intervals; Transformation approach;All these keywords.
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