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Goodness-of-fit tests for a semiparametric model under random double truncation

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  • Carla Moreira
  • Jacobo Uña-Álvarez
  • Ingrid Keilegom

Abstract

Doubly truncated data are commonly encountered in areas like medicine, astronomy, economics, among others. A semiparametric estimator of a doubly truncated random variable may be computed based on a parametric specification of the distribution function of the truncation times. This semiparametric estimator outperforms the nonparametric maximum likelihood estimator when the parametric information is correct, but might behave badly when the assumed parametric model is far off. In this paper we introduce several goodness-of-fit tests for the parametric model. The proposed tests are investigated through simulations. For illustration purposes, the tests are also applied to data on the induction time to acquired immune deficiency syndrome for blood transfusion patients. Copyright Springer-Verlag Berlin Heidelberg 2014

Suggested Citation

  • Carla Moreira & Jacobo Uña-Álvarez & Ingrid Keilegom, 2014. "Goodness-of-fit tests for a semiparametric model under random double truncation," Computational Statistics, Springer, vol. 29(5), pages 1365-1379, October.
  • Handle: RePEc:spr:compst:v:29:y:2014:i:5:p:1365-1379
    DOI: 10.1007/s00180-014-0496-z
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    References listed on IDEAS

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    1. Moreira, Carla & de Uña-Álvarez, Jacobo & Crujeiras, Rosa M., 2010. "DTDA: An R Package to Analyze Randomly Truncated Data," Journal of Statistical Software, Foundation for Open Access Statistics, vol. 37(i07).
    2. Zhou, Yong & Yip, Paul S. F., 1999. "A Strong Representation of the Product-Limit Estimator for Left Truncated and Right Censored Data," Journal of Multivariate Analysis, Elsevier, vol. 69(2), pages 261-280, May.
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    Cited by:

    1. Pao-sheng Shen & Yi Liu, 2019. "Pseudo maximum likelihood estimation for the Cox model with doubly truncated data," Statistical Papers, Springer, vol. 60(4), pages 1207-1224, August.
    2. Achim Dörre & Chung-Yan Huang & Yi-Kuan Tseng & Takeshi Emura, 2021. "Likelihood-based analysis of doubly-truncated data under the location-scale and AFT model," Computational Statistics, Springer, vol. 36(1), pages 375-408, March.
    3. Lior Rennert & Sharon X. Xie, 2018. "Cox regression model with doubly truncated data," Biometrics, The International Biometric Society, vol. 74(2), pages 725-733, June.
    4. Takeshi Emura & Ya-Hsuan Hu & Yoshihiko Konno, 2017. "Asymptotic inference for maximum likelihood estimators under the special exponential family with double-truncation," Statistical Papers, Springer, vol. 58(3), pages 877-909, September.
    5. Ya-Hsuan Hu & Takeshi Emura, 2015. "Maximum likelihood estimation for a special exponential family under random double-truncation," Computational Statistics, Springer, vol. 30(4), pages 1199-1229, December.

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