IDEAS home Printed from https://ideas.repec.org/a/ids/ijpqma/v5y2010i2p152-170.html
   My bibliography  Save this article

Reliability growth vs. HASS cost for product manufacturing with fast-to-market requirement

Author

Listed:
  • Balaji Janamanchi
  • Tongdan Jin

Abstract

This paper proposes a financial model to analyse the trade-off between the monetary benefits of reliability improvement and the costs associated with the implementation of highly accelerated stress screening (HASS) in the context of manufacturing the automatic test equipment (ATE). HASS is a reliability screening process that has been widely used as an effective tool to eliminate infant mortality and thereby improve the product mean-time-between-failures (MTBF). Furthermore, the feedback from HASS will help build quality into product and process design and thereby result in a more robust product design and production process leading to further improved MTBF. The cost-saving from improved MTBF thus obtained, is then continuously compared with the total cost of HASS implementation. The manufacturer achieves the breakeven (or better returns) as long as the HASS cost is equal to (or less than) the cost savings from the HASSed products relative to the non-HASSed products.

Suggested Citation

  • Balaji Janamanchi & Tongdan Jin, 2010. "Reliability growth vs. HASS cost for product manufacturing with fast-to-market requirement," International Journal of Productivity and Quality Management, Inderscience Enterprises Ltd, vol. 5(2), pages 152-170.
  • Handle: RePEc:ids:ijpqma:v:5:y:2010:i:2:p:152-170
    as

    Download full text from publisher

    File URL: http://www.inderscience.com/link.php?id=30740
    Download Restriction: Access to full text is restricted to subscribers.
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Khan, Samir & Phillips, Paul & Jennions, Ian & Hockley, Chris, 2014. "No Fault Found events in maintenance engineering Part 1: Current trends, implications and organizational practices," Reliability Engineering and System Safety, Elsevier, vol. 123(C), pages 183-195.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:ids:ijpqma:v:5:y:2010:i:2:p:152-170. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sarah Parker (email available below). General contact details of provider: http://www.inderscience.com/browse/index.php?journalID=177 .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.