Towards trustworthy machine fault diagnosis: A probabilistic Bayesian deep learning framework
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DOI: 10.1016/j.ress.2022.108525
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- Zhu, Zuanyu & Cheng, Junsheng & Wang, Ping & Wang, Jian & Kang, Xin & Yang, Yu, 2023. "A novel fault diagnosis framework for rotating machinery with hierarchical multiscale symbolic diversity entropy and robust twin hyperdisk-based tensor machine," Reliability Engineering and System Safety, Elsevier, vol. 231(C).
- Li, Xin & Li, Yong & Yan, Ke & Shao, Haidong & (Jing) Lin, Janet, 2023. "Intelligent fault diagnosis of bevel gearboxes using semi-supervised probability support matrix machine and infrared imaging," Reliability Engineering and System Safety, Elsevier, vol. 230(C).
- Zhao, Zeyun & Wang, Jia & Tao, Qian & Li, Andong & Chen, Yiyang, 2024. "An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis," Reliability Engineering and System Safety, Elsevier, vol. 244(C).
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Keywords
Intelligent fault diagnosis; Machine; Probabilistic Bayesian deep learning; Uncertainty; Trustworthy machine learning;All these keywords.
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