Thermal effects on the electrical degradation of thin film resistors
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- Pennetta, C. & Reggiani, L. & Trefán, Gy., 2001. "A Monte Carlo percolative approach to reliability analysis of semiconductor structures," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 55(1), pages 231-238.
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KeywordsPercolation models; 1/f electrical noise; Thin film failure;
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