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In-situ measurements of the optical properties of gold films near the percolation threshold

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  • Gadenne, P.
  • Yagil, Y.
  • Deutscher, G.

Abstract

D.C. resistance, mass thickness, optical reflectance and transmittance at two infrared wavelengths (1.7 and 2.2 μm) are performed during the deposition process of thin gold films. A very large absorption is found in the vicinity of the percolation threshold well below and after it, while the optical properties are only weakly wavelength and surface coverage dependent. We conclude that the fractal morphology dominates the optical properties in this region.

Suggested Citation

  • Gadenne, P. & Yagil, Y. & Deutscher, G., 1989. "In-situ measurements of the optical properties of gold films near the percolation threshold," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 157(1), pages 279-284.
    • Handle: RePEc:eee:phsmap:v:157:y:1989:i:1:p:279-284
    DOI: 10.1016/0378-4371(89)90313-0
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    References listed on IDEAS

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    1. Irwin Deutscher & Martha Beattie, 1988. "Success and Failure," Evaluation Review, , vol. 12(6), pages 607-624, December.
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    Cited by:

    1. Robin, Thierry & Souillard, Bernard, 1989. "Long wavelength properties of granular metal-insulator films: A microscopic approach," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 157(1), pages 285-292.

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    2. Robin, Thierry & Souillard, Bernard, 1989. "Long wavelength properties of granular metal-insulator films: A microscopic approach," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 157(1), pages 285-292.

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