How to measure patent thickets – a novel approach
The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.
|Date of creation:||15 Jun 2009|
|Date of revision:|
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